Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-17T17:15:34.507Z Has data issue: false hasContentIssue false
  • English
  • Français

Crystallization of YBa2Cu3O7-y films on SrTiO3(100) by postannealing of precursors prepared by dipping-pyrolysis process

Published online by Cambridge University Press:  03 March 2011

T. Manabe ,
W. Kondo ,
S. Mizuta  and
T. Kumagai
T. Manabe
Affiliation:
National Institute of Materials and Chemical Research, Tsukuba, Ibaraki 305, Japan
W. Kondo
Affiliation:
National Institute of Materials and Chemical Research, Tsukuba, Ibaraki 305, Japan
S. Mizuta
Affiliation:
National Institute of Materials and Chemical Research, Tsukuba, Ibaraki 305, Japan
T. Kumagai
Affiliation:
National Institute of Materials and Chemical Research, Tsukuba, Ibaraki 305, Japan
Get access

Extract

The effects of annealing temperature and oxygen partial pressure [p(O2)] were investigated on the crystallization and orientation of superconducting YBa2Cu3O7-y (YBCO) films on SrTiO3(100) prepared by the dipping-pyrolysis process. Annealing conditions for precursor films consisting of a Y2O3—BaCO3—CuO mixture were varied in the temperature range 700–850 °C and initial p(O2) range 2 × 10-4-10-2 atm followed by pure O2 treatment. Three different types of crystallization behavior were observed. The c-axis-oriented epitaxial YBCO films were obtained on the lower p(O2) and higher temperature side in the p(O2)-T diagram. The c/a-axis-oriented growth was observed in films heat-treated at 750–800 °C under p(O2) of 10-3 atm. In addition, mixtures of YBCO and YBa2Cu4O8 resulted when the films were annealed at 700 °C.

Type
Articles
Information
Journal of Materials Research , Volume 9 , Issue 4 , April 1994 , pp. 858 - 865
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Siegal, M. P., Phillips, J. M., van Dover, R.B., Tiefel, T. H., and Marshall, J. H., J. Appl. Phys. 68, 6353 (1990).CrossRefGoogle Scholar
2Feenstra, R., Lindemer, T. B., Budai, J. D., and Galloway, M. D., J. Appl. Phys. 69, 6569 (1991).CrossRefGoogle Scholar
3Mogro-Campero, A. and Turner, L. G., Appl. Phys. Lett. 58, 417 (1991).CrossRefGoogle Scholar
4Siegal, M. P., Hou, S. Y., Phillips, I. M., Tiefel, T. H., and Marshall, J. H., J. Mater. Res. 7, 2658 (1992).CrossRefGoogle Scholar
5Hase, T., Kita, R., Kawaguchi, K., Koga, T., and Morishita, T., Physica C 207, 58 (1993).CrossRefGoogle Scholar
6Mclntyre, P. C., Cima, M. J., and Ng, M. F., J. Appl. Phys. 68, 4183 (1990).CrossRefGoogle Scholar
7Mclntyre, P. C., Cima, M. J., Smith, J. A. Jr., Hallock, R. B., Siegal, M. P., and Phillips, J. M., J. Appl. Phys. 71, 1868 (1992).CrossRefGoogle Scholar
8Kumagai, T., Yamasaki, H., Endo, K., Manabe, T., Niino, H., Tsunoda, T., Kondo, W., and Mizuta, S., Jpn. J. Appl. Phys. 32, L1602 (1993).CrossRefGoogle Scholar
9Kumagai, T., Manabe, T., Kondo, W., Mizuta, S., and Arai, K., Appl. Phys. Lett. 61, 988 (1992).CrossRefGoogle Scholar
10Kumagai, T., Manabe, T., Kondo, W., Minamiue, H., and Mizuta, S., Jpn. J. Appl. Phys. 29, L940 (1990).CrossRefGoogle Scholar
11Manabe, T., Kondo, W., Mizuta, S., and Kumagai, T., Jpn. J. Appl. Phys. 30, L1641 (1991).CrossRefGoogle Scholar
12Manabe, T., Arai, K., Kondo, W., Mizuta, S., and Kumagai, T., J. Mater. Res. 7, 2337 (1992).CrossRefGoogle Scholar
13Hammond, R. H. and Bormann, R., Physica C 162–164, 703 (1989).CrossRefGoogle Scholar
14Derks, W. P. T., van Hal, H.A.M., and Langereis, C., Physica C 156, 62 (1988).CrossRefGoogle Scholar
15Wada, T., Suzuki, N., Ichinose, A., Yaegashi, Y., Yamauchi, H., and Tanaka, S., Appl. Phys. Lett. 57, 81 (1990).CrossRefGoogle Scholar
16Mathews, T. and Jacob, K. T., Appl. Phys. Lett. 57, 511 (1990).CrossRefGoogle Scholar
17Hayashi, H., Yamada, Y., Sugawara, K., Shiohara, Y., and Tanaka, S., Jpn. J. Appl. Phys. 30, L352 (1991).CrossRefGoogle Scholar