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Crystallization of various compositions in the Y2O3–SiO2 system

Published online by Cambridge University Press:  31 January 2011

Suresh Kumar  and
Charles H. Drummond III
Suresh Kumar*
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210
Charles H. Drummond III
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210
*
a)Present address: #120 Steidle Building, Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802.
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Abstract

In as-sintered silicon nitride with yttria as a sintering aid, the intergranular glassy phase contains Y, Si, O, and N. Results of crystallization of partly crystalline, as-quenched melt samples containing 28–40 mol% Y2O3 in the Y2O3–SiO2 system are presented. Three different compositions were melted in tungsten crucibles at 2100 °C in 1 and 50 atm nitrogen and heat treated in air in the temperature range of 1200 to 1600 °C. Phase identification by x-ray diffraction (XRD) and transmission electron microscopy (TEM) showed crystallization to β, γ, and δ polymorphs of Y2Si2O7.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 4 , April 1992 , pp. 997 - 1003
Copyright
Copyright © Materials Research Society 1992

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