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Critical evaluation of the Lotgering degree of orientation texture indicator

Published online by Cambridge University Press:  01 November 2004

Jacob L. Jones ,
Elliott B. Slamovich  and
Keith J. Bowman
Jacob L. Jones
Affiliation:
Materials Science and Engineering, Purdue University, West Lafayette, Indiana 47907
Elliott B. Slamovich
Affiliation:
Materials Science and Engineering, Purdue University, West Lafayette, Indiana 47907
Keith J. Bowman
Affiliation:
Materials Science and Engineering, Purdue University, West Lafayette, Indiana 47907
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Abstract

Preferred orientation in textured ceramics is often assessed by comparing the relative intensities of x-ray diffraction reflections to those of a randomly oriented ceramic using the Lotgering degree of orientation (f). However, this paper provides evidence that indiscriminate assessments of f can be misleading. Using measured intensities of a modestly textured tape cast bismuth titanate (Na0.5Bi4.5Ti4O15) ceramic, calculated f values vary from 7.4 to 73.2% depending on the reflections included in the calculation. The texture is also quantified by calculating the orientation distribution function (ODF) using measured pole figures. A model is then presented that demonstrates f is nonlinear with the multiple of preferred (00l)-orientations, the standard unit of the 00l pole figure.

Keywords

Crystallographic structureTextureX-ray diffraction (XRD)
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 11 , November 2004 , pp. 3414 - 3422
Copyright
Copyright © Materials Research Society 2004

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