Crossref Citations
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Crossref.
Elhadidy, H
Franc, J
Moravec, P
Höschl, P
and
Fiederle, M
2007.
Deep level defects in CdTe materials studied by thermoelectric effect spectroscopy and photo-induced current transient spectroscopy.
Semiconductor Science and Technology,
Vol. 22,
Issue. 5,
p.
537.
Babentsov, V.
Franc, J.
Elhadidy, H.
Fauler, A.
Fiederle, M.
and
James, R.B.
2007.
Dependence of the Sn0/2+ charge state on the Fermi level in semi-insulating CdTe.
Journal of Materials Research,
Vol. 22,
Issue. 11,
p.
3249.
Babentsov, V.
Franc, J.
Fauler, A.
Fiederle, M.
and
James, R.B.
2008.
Doping, compensation, and photosensitivity of detector grade CdTe.
Journal of Materials Research,
Vol. 23,
Issue. 6,
p.
1751.
Belas, Eduard
Bugar, Marek
Grill, Roman
Franc, Jan
and
Hoschl, Pavel
2009.
Preparation of Inclusion and Precipitate Free Semi-Insulating CdTe.
IEEE Transactions on Nuclear Science,
Vol. 56,
Issue. 4,
p.
1758.
Gutowski, J.
Sebald, K.
and
Voss, T.
2010.
New Data and Updates for III-V, II-VI and I-VII Compounds.
Vol. 44C,
Issue. ,
p.
324.
Panchuk, O.
and
Fochuk, P.
2010.
CdTe and Related Compounds; Physics, Defects, Hetero- and Nano-structures, Crystal Growth, Surfaces and Applications.
p.
309.
Elhadidy, H
Dedic, V
Franc, J
and
Grill, R
2014.
Study of polarization phenomena in n-type CdZnTe.
Journal of Physics D: Applied Physics,
Vol. 47,
Issue. 5,
p.
055104.
Zázvorka, J
Hlídek, P
Franc, J
Pekárek, J
and
Grill, R
2016.
Photoluminescence study of surface treatment effects on detector-grade CdTe:In.
Semiconductor Science and Technology,
Vol. 31,
Issue. 2,
p.
025014.
Gul, R.
Roy, U. N.
and
James, R. B.
2017.
An analysis of point defects induced by In, Al, Ni, and Sn dopants in Bridgman-grown CdZnTe detectors and their influence on trapping of charge carriers.
Journal of Applied Physics,
Vol. 121,
Issue. 11,
Elhadidy, H.
Mahi, F.Z.
Franc, J.
Musiienko, A.
Dedic, V.
and
Schneeweiss, O.
2018.
High frequency noise calculation in Schottky metal-semiconductor-metal structure and parameter retrieval of nanometric CdTe structure.
Thin Solid Films,
Vol. 645,
Issue. ,
p.
340.
Elhadidy, H.
Mahi, F. Z.
Franc, J.
Musiienko, A.
Dedic, V.
and
Schneeweiss, O.
2019.
Calculations of High-Frequency Noise Spectral Density of Different CdTe Metal–Semiconductor–Metal Schottky Contacts.
Journal of Electronic Materials,
Vol. 48,
Issue. 12,
p.
7806.