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Casting and machining of devices of high temperature superconducting BSCCO

Published online by Cambridge University Press:  08 February 2011

R.J. Rayne
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
L.E. Toth
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
B.A. Bender
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
S.H. Lawrence
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
M.M. Miller
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
R.J. Soulen Jr.
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
G. Candella
Affiliation:
Naval Research Laboratory, Washington, DC 20375–5000
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Abstract

Magnetic shields for SQUID applications were successfully fabricated using high Tc superconducting Bi–Sr–Ca–Cu–O (BSCCO). In order to produce shields with adequate superconducting properties and close dimensional control, it was necessary to develop several new processing techniques. Shields were produced by casting liquid BSCCO into molds, heat treating, and machining. A series of BSCCO alloys with different compositions were cast from the molten state into metal molds and subsequently heat treated to render the castings superconducting. The heat-treating cycles were studied with the aid of thermogravimetric analysis (TGA), differential thermal analysis (DTA), and dilatometer measurements. The phases and microstructures after various heat-treating cycles were monitored by x-ray diffraction (XRD), optical microscopy, and scanning electron microscopy (SEM). Superconducting properties were measured after various stages of heat treatment and machining. Prototype magnetic shields were machined from bulk castings and found to perform successfully. The most significant factor in shield quality was the nominal composition of the shield, which was shown by transmission electron microscopy (TEM) to affect the grain boundary chemistry.

Type
Articles
Copyright
Copyright © Materials Research Society 1991

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References

1Maeda, H., Tanaka, Y., Fukotami, M., and Asano, T., Jpn. J. Appl. Phys. 27, L209 (1988).CrossRefGoogle Scholar
2Hazen, R. M., Prewitt, C. T., Angel, R. J., Ross, N. L., Finger, L. W., Hadidiacos, C. G., Veblen, D. R., Heaney, P. J., Hor, P. H., Meng, R. L., Sun, Y. Y., Wang, Y. Q., Xue, Y.Y, Huang, Z. J., Gao, L., Bechtold, J., and Chu, C. W., Phys. Rev. Lett. 60, 1174 (1988).CrossRefGoogle Scholar
3Subramanian, M. A., Torardi, C. C., Calabrese, J. C., Gopalakrishnan, J., Morrissey, K. J., Askew, T. R., Flippen, R. B., Chowdhry, U., and Sleight, A. W., Science 239, 1015 (1988).CrossRefGoogle Scholar
4Hinks, D. G., Soderholm, L., IICapone, D. W., Dabrowski, B., Mitchell, A. W., and Shi, D., Appl. Phys. Lett. 53, 423 (1988).CrossRefGoogle Scholar
5Zheng, H., Xu, R., and Mackenzie, J. D., J. Mater. Res. 4, 911 (1989).CrossRefGoogle Scholar
6 MACOR is a glass-ceramic manufactured by Corning, Inc., Corning, NY.Google Scholar
7Nassau, K., Miller, A. E., and Gyorgy, E. M., Mater. Res. Bull. XXIV, 711 (1989).CrossRefGoogle Scholar
8Morgan, P. E. D., Ratto, J. J., Housley, R. M., and Porter, J. R., in Better Ceramics Through Chemistry III, edited by Brinker, C. J., Clark, D. E., and Ulrich, D. R. (Mater. Res. Soc. Symp. Proc. 121, Pittsburgh, PA, 1988), p. 421.Google Scholar
9Michel, C., Hervieu, M., Borel, M. M., Grandin, A., Deslandes, F., Provost, J., and Raveau, B., Z. Phys. B 68, 421 (1987).CrossRefGoogle Scholar
10von Schnering, H. G., Walz, L., Schwarz, M., Becker, W., Hartweg, M., Popp, T., Hettich, B., Müller, P., and Kampf, G., Angew. Chem. Int. Ed. Engl. 27, 574 (1988).CrossRefGoogle Scholar
11Roth, R. S., Rawn, C. J., and Bendersky, L. A., J. Mater. Res. 5, 46 (1990).CrossRefGoogle Scholar
12Shi, D., Tang, M., Vandervoort, K., and Claus, H., Phys. Rev. B 39, 9091 (1989).CrossRefGoogle Scholar
13Arendt, R. H., Garbauskas, M. F., and Schilling, L. L., J. Mater. Res. 5, 33 (1990).CrossRefGoogle Scholar