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A brittleness transition in silicon due to scale

Published online by Cambridge University Press:  04 November 2011

William W. Gerberich ,
Douglas D. Stauffer ,
Aaron R. Beaber  and
Natalia I. Tymiak
William W. Gerberich*
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
Douglas D. Stauffer
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
Aaron R. Beaber
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
Natalia I. Tymiak
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

To understand the brittleness transition in low-toughness materials, the nucleation and kinetics of dislocations must be measured and modeled. One aspect overlooked is that the apparent activation energy for plasticity is modified at very high stresses. Coupled with state of stress and length scale effects on plasticity, the lowering of the brittle-to-ductile transition (BDT) in such materials can be partially understood. Experimental evidence in silicon single crystals in the length scale regime of 40 nm to 1 mm is presented. It is shown that high stress affects both length scale and temperature-dependent properties of activation volume and activation energy for dislocation nucleation and/or mobility. Nanoparticles and nanopillars of single-crystal silicon demonstrate unexpectedly high fracture toughness at low temperatures under compression. A thermal activation approach can model the three decades of size associated with the factor of three absolute temperature shift in the BDT.

Keywords

DislocationsFractureNanoscale
Type
Articles
Information
Journal of Materials Research , Volume 27 , Issue 3: Focus Issue: Advances in Mechanics of One-Dimensional Micro/Nanomaterials , 14 February 2012 , pp. 552 - 561
Copyright
Copyright © Materials Research Society 2011

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