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Biaxially textured yttria stabilized zirconia buffer layers on rotating cylindrical surfaces

Published online by Cambridge University Press:  31 January 2011

J. Hoffmann ,
J. Dzick ,
J. Wiesmann ,
K. Heinemann ,
F. Garcia-Moreno  and
H. C. Freyhardt
J. Hoffmann
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-7, D-37073 Göttingen, Germany
J. Dzick
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-7, D-37073 Göttingen, Germany
J. Wiesmann
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-7, D-37073 Göttingen, Germany
K. Heinemann
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-7, D-37073 Göttingen, Germany
F. Garcia-Moreno
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-7, D-37073 Göttingen, Germany
H. C. Freyhardt
Affiliation:
Institut für Metallphysik, Universität Göttingen, Hospitalstr. 3-7, D-37073 Göttingen, Germany
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Abstract

Biaxially textured yttria stabilized zirconia (YSZ) buffer layers are prepared on rotating cylindrical surfaces by an ion-beam-assisted deposition (IBAD) process. A large fraction of the cylinder surface can be coated at the same time, resulting in an effective deposition rate of 40 nm/h for the whole tube circumference (diameter of the tube 12 mm). The in-plane alignment depends on the total film thickness and the rotation velocity. The best in-plane textures achieved so far with a full width half maximum (FWHM) value of 27° are sufficient for the preparation of YbaCuO films with critical current densities above 105 A cm−2 at 77 K and self-fields.

Type
Articles
Information
Journal of Materials Research , Volume 12 , Issue 3 , March 1997 , pp. 593 - 595
Copyright
Copyright © Materials Research Society 1997

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