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All chemical YBa2Cu3O7 superconducting multilayers: Critical role of CeO2 cap layer flatness

Published online by Cambridge University Press:  31 January 2011

M. Coll*
Affiliation:
Institut de Ciencia de Materials de Barcelona (ICMAB/CSIC) Campus de la UAB, Barcelona 08193, Spain
J. Gàzquez
Affiliation:
Institut de Ciencia de Materials de Barcelona (ICMAB/CSIC) Campus de la UAB, Barcelona 08193, Spain
R. Huhne
Affiliation:
Institut de Ciencia de Materials de Barcelona (ICMAB/CSIC) Campus de la UAB, Barcelona 08193, Spain
B. Holzapfel
Affiliation:
IFW-Dresden, Institute for Metallic Materials, 01171 Dresden, Germany
Y. Morilla
Affiliation:
Institut de Ciencia de Materials de Barcelona (ICMAB/CSIC) Campus de la UAB, Barcelona 08193, Spain
J. García-López
Affiliation:
Centro Nacional de Aceleradores, E-41092 Sevilla, Spain
A. Pomar
Affiliation:
Institut de Ciencia de Materials de Barcelona (ICMAB/CSIC) Campus de la UAB, Barcelona 08193, Spain
F. Sandiumenge
Affiliation:
Institut de Ciencia de Materials de Barcelona (ICMAB/CSIC) Campus de la UAB, Barcelona 08193, Spain
T. Puig
Affiliation:
Institut de Ciencia de Materials de Barcelona (ICMAB/CSIC) Campus de la UAB, Barcelona 08193, Spain
X. Obradors
Affiliation:
Institut de Ciencia de Materials de Barcelona (ICMAB/CSIC) Campus de la UAB, Barcelona 08193, Spain
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

New advances toward microstructural improvement of epitaxial CeO2 films grown by chemical solution deposition and their use as buffer layers for YBa2Cu3O7 (YBCO) films are presented. We demonstrate that the degree of epitaxy and the fraction of (001) atomically flat surface area are controlled by the incorporation of tetravalent (Zr4+) or trivalent (Gd3+) cations into the ceria lattice. The degree of epitaxy has been investigated by means of Rutherford backscattering spectroscopy-channeling and reflection high-energy electron diffraction, and a new methodology is also presented to quantify the fraction of (001) atomically flat area from atomic force microscopy images. Results are further correlated with the superconducting properties, microstructure, and texture of YBCO films grown by the trifluoroacetate route. A comparison with pulsed laser deposition and YBCO films grown on the same ceria layers is also presented. This growth procedure has allowed us to obtain all chemical multilayer films with controlled microstructure and critical current densities above 4 MA cm−2 at 77 K.

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Articles
Copyright
Copyright © Materials Research Society 2009

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