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Stochastic Modeling for Environmental Stress Screening

Published online by Cambridge University Press:  19 February 2016

Ji Hwan Cha*
Affiliation:
Ewha Womans University
Maxim Finkelstein*
Affiliation:
University of the Free State and University ITMO
*
Postal address: Department of Statistics, Ewha Womans University, Seoul, 120-750, Korea. Email address: [email protected].
∗∗ Postal address: Department of Mathematical Statistics, University of the Free State, 339 Bloemfontein 9300, South Africa. Email address: [email protected].
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Abstract

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Environmental stress screening (ESS) of manufactured items is used to reduce the occurrence of future failures that are caused by latent defects by eliminating the items with these defects. Some practical descriptions of the relevant ESS procedures can be found in the literature; however, the appropriate stochastic modeling and the corresponding thorough analysis have not been reported. In this paper we develop a stochastic model for the ESS, analyze the effect of this operation on the population characteristics of the screened items, and also consider the relevant optimization issues.

Type
Research Article
Copyright
© Applied Probability Trust 

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