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Image analysis of wheat grains developed in different environments and its implications for identification

Published online by Cambridge University Press:  06 March 2006

J. K. SAINIS
Affiliation:
Bhabha Atomic Research Centre, Mumbai-400 085, India
S. P. SHOUCHE
Affiliation:
Bhabha Atomic Research Centre, Mumbai-400 085, India
S. G. BHAGWAT
Affiliation:
Bhabha Atomic Research Centre, Mumbai-400 085, India

Abstract

Varietal identification is an important aspect of crop research and utilization. Identification using computer-based image analysis could be an alternative to visual identification. However, the effectiveness of image analysis systems needs to be established under various real conditions. Three wheat varieties were sown on three different dates. Variation in the grain size and shape of these varieties, brought about by changes in the environmental conditions, was measured using Comprehensive Image Processing Software (CIPS). Some parameters showed considerable grain-to-grain variation, which was either inherent or due to environmental changes during grain filling. Euclidean distances were calculated using either means of all the parameters (ED1), or using only those parameters that did not show a high coefficient of variation (ED2). For samples of the same variety sown at different times, Euclidean distances were smaller compared with samples of different varieties, indicating that grains of the same variety resembled one another. By using the criterion of minimum Euclidean distance it was possible to distinguish between varieties, in spite of variation in grain shape and size due to environmental conditions. It was possible to identify correctly an unknown sample, taken as a test case.

Type
Crops and Soils
Copyright
© 2006 Cambridge University Press

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