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A proof of concept of a non-resonant near-field microwave microscope based on a high impedance reflectometer

Published online by Cambridge University Press:  03 June 2013

David Glay ,
Adelhatif El Fellahi  and
Tuami Lasri
David Glay*
Affiliation:
IEMN – University of Lille 1, Av. Poincaré – CS 60069, 59652 Villeneuve d'Ascq, France. Phone: +33 (0)320197941
Adelhatif El Fellahi
Affiliation:
IEMN – University of Lille 1, Av. Poincaré – CS 60069, 59652 Villeneuve d'Ascq, France. Phone: +33 (0)320197941
Tuami Lasri
Affiliation:
IEMN – University of Lille 1, Av. Poincaré – CS 60069, 59652 Villeneuve d'Ascq, France. Phone: +33 (0)320197941
*
Corresponding author: D. Glay Email: [email protected]
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Abstract

In this paper, we present a non-resonant high impedance reflectometer with a reference impedance close to one of the tip probe of a near-field microwave microscope. We show that for an apex of the tip probe of 100 µm there is an optimum reference impedance close to 1 kΩ. To validate this approach a microwave circuit that makes use of lumped elements has been fabricated. A proof of concept is also explored for capacitance measurements between the tip probe and a metal plate.

Keywords

Characterization of material parametersCircuit design and applicationsNear-field microwave microscopy
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 5 , Special Issue 3: European Microwave Week 2012 , June 2013 , pp. 301 - 308
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2013 

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References

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