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On the losses in substrate-integrated waveguides and cavities

Published online by Cambridge University Press:  02 September 2009

Maurizio Bozzi ,
Marco Pasian ,
Luca Perregrini  and
Ke Wu
Maurizio Bozzi*
Affiliation:
Department of Electronics, University of Pavia, Via Ferrata 1, 27100 Pavia, Italy. Phone: +39 0382 985223; Fax: +39 0382 422583.
Marco Pasian
Affiliation:
Department of Electronics, University of Pavia, Via Ferrata 1, 27100 Pavia, Italy. Phone: +39 0382 985223; Fax: +39 0382 422583.
Luca Perregrini
Affiliation:
Department of Electronics, University of Pavia, Via Ferrata 1, 27100 Pavia, Italy. Phone: +39 0382 985223; Fax: +39 0382 422583.
Ke Wu
Affiliation:
Poly-Grames Research Center, École Polytechnique de Montréal, 2500, Chemin de Polytechnique, Montréal, Québec H3T 1J4, Canada
*
Corresponding author: Maurizio Bozzi E-mail: [email protected]
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Abstract

This paper presents a study of losses in substrate-integrated waveguides (SIWs) and cavities. Three mechanisms of losses are considered and separately investigated, namely radiation leakage, ohmic loss, and dielectric loss. A systematic comparison of waveguides with different geometry, operating at different frequencies, is reported. This study permits to give a physical interpretation of the loss mechanisms and to identify design criteria to minimize losses. A similar analysis is also developed in this work for the case of SIW resonant cavities. For these structures, a different variation of losses with respect to frequency is found, which reduces the effectiveness of the design criteria established for SIWs.

Keywords

Substrate-integrated waveguideOhmic lossesDielectric lossesResonant cavity
Type
Original Article
Information
International Journal of Microwave and Wireless Technologies , Volume 1 , Issue 5 , October 2009 , pp. 395 - 401
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2009

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References

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