Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-22T07:16:34.083Z Has data issue: false hasContentIssue false
  • English
  • Français

A method for the determination of the complex permittivity by detuned ring resonators for bulk materials up to 110 GHz

Published online by Cambridge University Press:  30 March 2015

Armin Talai ,
Frank Steinhäußer ,
Achim Bittner ,
Ulrich Schmid ,
Robert Weigel  and
Alexander Koelpin Open the ORCID record for Alexander Koelpin [Opens in a new window]
Armin Talai*
Affiliation:
Institute for Electronics Engineering, Friedrich-Alexander-University, Cauerstraße 9, D-91058 Erlangen, Germany. Phone: + 49 9131 8528847
Frank Steinhäußer
Affiliation:
Institute of Sensor and Actuator Systems, Vienna University of Technology, Floragasse 7, A-1040 Vienna, Austria
Achim Bittner
Affiliation:
Institute of Sensor and Actuator Systems, Vienna University of Technology, Floragasse 7, A-1040 Vienna, Austria
Ulrich Schmid
Affiliation:
Institute of Sensor and Actuator Systems, Vienna University of Technology, Floragasse 7, A-1040 Vienna, Austria
Robert Weigel
Affiliation:
Institute for Electronics Engineering, Friedrich-Alexander-University, Cauerstraße 9, D-91058 Erlangen, Germany. Phone: + 49 9131 8528847
Alexander Koelpin
Affiliation:
Institute for Electronics Engineering, Friedrich-Alexander-University, Cauerstraße 9, D-91058 Erlangen, Germany. Phone: + 49 9131 8528847
*
Corresponding author: A. Talai Email: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

An accurate characterization of microwave materials is essential for reliable high-frequency circuit design. This paper presents a measurement setup, which enables a quick and accurate determination of the relative permittivity of dielectric bulk materials up to 110 GHz. A ring-resonator is manufactured on a well-characterized substrate, serving as reference resonator. The material under test (MUT) is placed on top of the ring, which increases the effective permittivity and therefore introduces a shift of the resonance frequency of the resonator. In case of moderate to large dielectric losses of the MUTs, the quality factor of the resonator decreases perceptibly, which provides conclusions about the dielectric losses. Electromagnetic field simulations with different heights and relative permittivities of the MUTs provide a look-up table for the measured resonance frequencies. The functionality of the proposed measurement setup is validated by measurement results of different MUTs.

Keywords

Characterization of material parametersMicrowave measurements
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 7 , Special Issue 3-4: European Microwave Week 2014 , June 2015 , pp. 251 - 260
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2015 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Richtmyer, R.D.: Dielectric resonators. J. Appl. Phys., 10 (6) (1939), 391–398.Google Scholar
[2] Bernard, P.A., Gautray, J.M.: Measurement of dielectric constant using a microstrip ring resonator. IEEE Trans. Microw. Theory Tech., 39 (3) (1991), 592–595.Google Scholar
[3] Yamashita, E., Mittra, R.: Variational methods for the analysis of microstrip lines. IEEE Trans. Microw. Theory Tech., 16 (1968), 251–256.Google Scholar
[4] Ghodgaonkar, D.K., Varadan, V.V., Varadan, V.K.: A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies. IEEE Trans. Instrum. Meas., 37 (3) (1989), 789–793.Google Scholar
[5] Will, B., Gerding, M., Schulz, C., Baer, C., Musch, T., Rolfes, I.: A time domain transmission measurement system for dielectric characterizations. Int. J. Microw. Wireless Technol., 4 (Special Issue 03) (2012), 349–355.Google Scholar
[6] Niwat, A.: Harmonic suppression of microstrip ring resonator using double spurlines. J. Phys. Sci., 7 (2012), 31–36.Google Scholar
[7] Hopkins, R., Free, C.: Equivalent circuit for the microstrip ring resonator suitable for broadband materials characterisation. IET Microw. Antennas Propag., 2 (2008), 66–73.Google Scholar
[8] Grant, I.S., Phillips, W.R.: Electromagnetism, Manchester Physics, 2nd ed., John Wiley & Sons, University of Manchester, England, 2008.Google Scholar
[9] Sihvola, A.H., Kong, J.A.: Effective permittivity of dielectric mixtures. IEEE Trans. Geosci. Remote Sens., 26 (4) (1988), 420–429.Google Scholar
[10] Computer Simulation Technology Studio Suite, 2013, https://www.cst.com.Google Scholar
[11] Talai, A., Steinhäußer, F., Bittner, A., Schmid, U., Weigel, R., Koelpin, A.: The Influence by trapezoidal conductor shapes on ring-resonator based material characterization up to 110 GHz, in IEEE Int. Conf. on Numerical Electromagnetic Modeling and Optimization, NEMO, Pavia, Italy, May 2014, pp. 1–4.Google Scholar
[12] Rosenberger HF Technology: 01K80A-40ML5, RPC-1.00, 110 GHz SMD Connector jack, http://www.rosenberger.de/en/index.php.Google Scholar
[13] Weil, C.M.; Jones, C.A.; Kantor, Y.; Grosvenor, J.H. Jr.: On RF material characterization in the stripline cavity. IEEE Trans. Microw. Theory Tech., 48 (2) (2000), 266–275.Google Scholar
[14] Santos, J., Garcia, D., Eiras, J.A.: Dielectric characterization of materials at microwave frequency range. Mater. Res., 6 (1) (2003), ISSN 1516-1439, pp. 97–101.Google Scholar
[15] Fehlen, R.G.: Air gap error compensation for coaxial transmission line method of electromagnetic material characterization. Thesis, Air Force Institute of Technology, 2006, Wright-Patterson Air Force Base, Ohio, USA.Google Scholar
[16] Kärkkäinen, K.K., Sihvola, A.H., Nikoskinen, K.I.: Effective permittivity of mixtures: numerical validation by the FDTD method. IEEE Trans. Geosci. Remote Sens., 38 (3) (2000), 1303–1308.Google Scholar
[17] Kapoor, M., Daya, K.S., Tyagi, G.S.: Coupled ring resonator for microwave characterization of dielectric materials. Int. J. Microw. Wireless Tech., 4 (Special Issue 02) (2012), 241–246.Google Scholar