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Measurement method for characterizing a millimeter-wave traveling-wave power combiner using in-situ test accessories

Published online by Cambridge University Press:  01 August 2019

Honglei Sun Open the ORCID record for Honglei Sun [Opens in a new window] ,
Xiao-Wei Zhu Open the ORCID record for Xiao-Wei Zhu [Opens in a new window] ,
Xuesong Shi Open the ORCID record for Xuesong Shi [Opens in a new window]  and
Ruijia Liu Open the ORCID record for Ruijia Liu [Opens in a new window]
Honglei Sun
Affiliation:
School of Information Science and Engineering, Southeast University, Nanjing 210096, China
Xiao-Wei Zhu
Affiliation:
School of Information Science and Engineering, Southeast University, Nanjing 210096, China
Xuesong Shi
Affiliation:
School of Information Science and Engineering, Southeast University, Nanjing 210096, China
Ruijia Liu
Affiliation:
School of Information Science and Engineering, Southeast University, Nanjing 210096, China
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Abstract

This paper presents a novel assessment method that minimizes test-fixture-induced errors in non-coaxial power combiner measurement by extending the port reduction method. This method involves terminating certain ports to acquire the scattering matrix of an N-port network from the scattering matrix measured at a reduced port order. The entire DUT scattering matrix is obtained from multiple scanning measurements, which are taken from partial coaxial accessible ports, based on a set of configurable terminating states. This advantage is leveraged to exclude a major portion of coaxial launch structures that would otherwise be incorporated in the conventional multiport test fixture. An analogous concept here is applied to measure a waveguide traveling-wave power combiner. A sandwiched twin structure, containing a divider/combiner pair with certain auxiliary through-type components cushioned between them, is utilized to assess the combiner characteristics. A theoretical framework of the proposed method was established to test its potential precision. Thereafter, an in-situ implementation was conducted to test its practical application on a traveling-wave combined amplifier prototype operating at the Q-band (33–39 GHz).

Keywords

Microwave MeasurementsPassive components and circuitspower divider/combinermultiport networkmicrostrip structuresrectangular waveguideHigh RF-power amplifier
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 12 , Issue 1 , February 2020 , pp. 48 - 57
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2019 

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