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Dielectric characterization using FEM modeling and ANNs for coaxial waveguide with conical open ended radiation

Published online by Cambridge University Press:  08 March 2016

Mohamed Mounkid El Afendi*
Affiliation:
Faculty of Electronics and Computers, University of Sciences and Technology Houari Boumediene, BP 32 El Alia, 16111 Bab Ezzouar, Algiers, Algeria. Phone: +213 558 77 10 45
Mohamed Tellache
Affiliation:
Faculty of Electronics and Computers, University of Sciences and Technology Houari Boumediene, BP 32 El Alia, 16111 Bab Ezzouar, Algiers, Algeria. Phone: +213 558 77 10 45
Junwu Tao
Affiliation:
INPT-ENSEEIHT, 2 rue Charles Camichel, BP 7122, 31071 Toulouse, Cedex 7, France
Bilal Hadjadji
Affiliation:
Faculty of Electronics and Computers, University of Sciences and Technology Houari Boumediene, BP 32 El Alia, 16111 Bab Ezzouar, Algiers, Algeria. Phone: +213 558 77 10 45
Mouncef Benmimoune
Affiliation:
Université du Québec à Montréal, 201, av. President-Kennedy, Montreal, QC H2X 3Y7, Canada
*
Corresponding author:M. El Afendi Email: [email protected]

Abstract

Since last decades, microwaves have received tremendous attention as an interesting tool for material characterization. In general, standard microwave measurement methods require cutting and polishing of samples to put it in a suitable waveguide or cavity. However, several methods have been developed in order to permit a non-destructive measurement. A well-known method is based on coaxial open-ended waveguide, which is used as a sensor for dielectric characterizations. Moreover, with the requirement of new forms, developing mathematical model for each one is not convenient. Indeed, the complex structures required in the industrial field can be perfectly designed with high-performance three-dimensional software. Many attempts have been done to solve the conversion problem by proposing different algorithms. Nevertheless, they are sensitive for complex structure that contains transition part. In this paper, we propose a dielectric measurement method based on the use of coaxial waveguide. A novel algorithm for dielectric characterization of complex structures is also presented, which is based on the joint use of artificial neuronal networks and finite element method. The proposed algorithm aims to find the dielectric characterization for complex structures. Experimental evaluations applied to solid and liquid dielectrics confirm the validation of the proposed algorithm.

Type
Research Papers
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2016 

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References

REFERENCES

[1] Cheng, G.; Liu, L.; Cai, D.; et al.: Microwave measurement of dielectric properties using the TM011 and TE011 modes excited by a generalized nonradiative dielectric resonator. Meas. Sci. Technol., 23 (11) (2012), 115901115912.CrossRefGoogle Scholar
[2] Kang, B.; Cho, J.; Cheon, C.; Kwon, Y.: Nondestructive measurement of complex permittivity and permeability using mutillayered coplanar waveguide structures. IEEE Microw. Wireless Compon. Lett., 15 (5) (2005), 381382.CrossRefGoogle Scholar
[3] Hasar, U.C.: A fast and accurate amplitude-only transmission-reflection method for complex permittivity determination of lossy materials. IEEE Trans. Microw. Theory Tech., 56 (9) (2008), 21292135.CrossRefGoogle Scholar
[4] Popovic, D. et al. : Precision open-ended coaxial probes for in vivo and ex vivo Spectroscopy of biological tissues at microwave frequencies. Trans. IEEE Microw. Theory Tech., MTT-53, 5 (2005), 17131721.CrossRefGoogle Scholar
[5] Muhamad, F.; Baba, N.H.; Awang, Z.; Ghodgaonkar, D.K.: Microwave non-destructive testing of semiconductor wafers in the frequency range 8–12.5 GHz, in Proc. IEEE Int. Conf. Semiconductor Electronics, 2002, 561565.Google Scholar
[6] Tamyis, N.; Ramli, A.; Ghodgaonkar, D.K.: Free space measurement of complex permittivity and complex permeability of magnetic materials using open circuit and short circuit method at microwave frequencies, in IEEE Student Conf. on Research and Development, 2002, 394398.Google Scholar
[7] Belenky, V.G. et al. : Accurate microwave resonant method for complex permittivity measurements of liquids. IEEE Trans. Microw. Theory Techn., 48 (11) (2000), 21592164.Google Scholar
[8] Luukkonen, O.; Maslovski, S.I.; Tretyakov, S.A.: A stepwise Nicolson–Ross–Weir-based material parameter extraction method. IEEE Antennas Wireless Propag. Lett., (2011), 12951298.CrossRefGoogle Scholar
[9] De Paula, A.L.; Barroso, J.J.; Rezende, M.C.: Modified Nicolson–Ross–Weir (NRW) method to retrieve the constitutive parameters of low-loss materials, in Microwave & Optoelectronics Conf., 2011, 488492.CrossRefGoogle Scholar
[10] Hasar, U.C.: A microwave method for noniterative constitutive parameters determination of thin low-loss or lossy materials. IEEE Trans. Microw. Theory Tech., 57 (6) (2009), 15951601.CrossRefGoogle Scholar
[11] Baker-Jarvis, J.; Janezic, M.; Grosvenor, J.; Geyer, R.: Transmission/reflection and short-circuit line methods for measuring permittivity and permeability, in National Institute of Standards and Technology, Technical Note 1355-R, 1993.Google Scholar
[12] Scott, W.R.: A new technique for measuring the constitutive parameters of planar materials. IEEE Trans. Instrum. Meas., 41 (5) (1992), 639645.CrossRefGoogle Scholar
[13] Jin, J.: The Finite Element Method in Electromagnetics, 3rd ed., Wiley, Hoboken, NJ, USA, 2014.Google Scholar
[14] Madenci, E.; Guven, I.: The Finite Element Method and Application in Engineering Using ANSYS, Springer Internation Publishing, 2015.CrossRefGoogle Scholar
[15] Bartley, P.G.; McClendon, R.W.; Nelson, S.O.: Permittivity determination by using an artificial neural network, in IEEE Instruments and Measurement Technology Conf., 1999, 2730.Google Scholar
[16] Eugene, E.; Kopyt, E.P.; Yakovlev, V.V.: Determination of complex permittivity with neural networks and FDTD modeling. Microw. Opt. Technol. Lett., 40 (3) (2004), 183188.Google Scholar
[17] Acikgoz, H.; Le Bihan, Y.; Meyer, O.; Pichon, L.: Microwave characterization of dielectric materials using bayesian neural networks. Progress Electromagn. Res., 3 (2008), 169182.CrossRefGoogle Scholar
[18] Mumbongo-Kambok, S. et al. : Original calibration method for dielectric property measurement cell of natural materials, in Int. Conf. on Microwave and High Frequency Heating, 2009.Google Scholar
[19] Harrington, R.F.: Time Harmonic Electromagnetic Fields, McGraw-Hill, New York, 1961.Google Scholar