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Design, simulation, and fabrication of broadband coaxial matched loads for the frequency range from 0 to 110 GHz

Published online by Cambridge University Press:  12 March 2014

Andreas Tag ,
Jens Leinhos ,
Gerd Hechtfischer ,
Martin Leibfritz  and
Thomas Eibert
Andreas Tag*
Affiliation:
Institute for Electronics Engineering, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstrasse 9, 91058 Erlangen, Germany
Jens Leinhos
Affiliation:
Rohde & Schwarz GmbH & Co. KG, Mühldorfstrasse 15, 81671 Munich, Germany
Gerd Hechtfischer
Affiliation:
Rohde & Schwarz GmbH & Co. KG, Mühldorfstrasse 15, 81671 Munich, Germany
Martin Leibfritz
Affiliation:
Rohde & Schwarz GmbH & Co. KG, Mühldorfstrasse 15, 81671 Munich, Germany
Thomas Eibert
Affiliation:
Insitute for High-Frequency Engineering, Technische Universität München, Arcisstrasse 21, 80333 Munich, Germany
*
Corresponding author: A. Tag Email: [email protected]
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Abstract

Combining a theory for reflection-free termination of coaxial lines together with a novel manufacturing method results in 1-mm coaxial matched loads with an excellent absorption behavior over the frequency range from 0 to 110 GHz. Three different electromagnetic (EM) simulation approaches verify the capability of these matched loads to achieve reflection coefficients smaller than −43 dB over the entire frequency range. Matched loads with a maximum reflection coefficient of only −32 dB have been produced. An excellent performance was achieved by exponentially tapering the outer conductor over the region of a coaxial ceramic substrate coated by a thin-film resistance and by compensation for EM wave propagation inside the resistive coating.

Keywords

Microwave measurementsModelingSimulation and characterizations of devices and circuits
Type
Research Paper
Information
International Journal of Microwave and Wireless Technologies , Volume 6 , Issue 3-4: European Microwave Week 2013 , June 2014 , pp. 297 - 304
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2014 

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References

REFERENCES

[1]IEEE Instrum. Meas. Soc., IEEE standard for precision coaxial connectors (DC to 110 GHz), IEEE Std 287, September 2007.Google Scholar
[2]Maury, S.M.M.; Simpson, G.: LRLs calibration of vector automatic network analyzers. Microw. J., 30 (5) (1987), 387–391.Google Scholar
[3]Engen, G.; Hoer, C.: Thru-reflect-line: an improved technique for calibrating the dual six-port automatic network analyzer. IEEE Trans. Microw. Theory Tech., 27 (12) (1979), 987–993.CrossRefGoogle Scholar
[4]Lee, Y.S.; Roberts, T.: Accuracy study on the newly introduced anritsu w1-connector calibration and verification kit, in ARFTG Microwave Measurements Conf., December 2003, 109–118.Google Scholar
[5]Hoer, C.: Choosing line lengths for calibrating network analyzers. IEEE Trans. Microw. Theory Tech., 31 (1) (1983), 76–78.CrossRefGoogle Scholar
[6]Blackham, D.: Application of weighted least squares to OSL vector error correction, in 61st ARFTG Conf. Digest, June 2003, 11–21.Google Scholar
[7]Bauer, R.F.; Penfield, P.: De-embedding and unterminating. IEEE Trans. Microw. Theory Tech., 22 (3) (1974), 282–288.CrossRefGoogle Scholar
[8]Kruppa, W.; Sodomsky, K.: An explicit solution for the scattering parameters of a linear two-port measured with an imperfect test set (correspondence). IEEE Trans. Microw. Theory Tech., 19 (1) (1971), 122–123.CrossRefGoogle Scholar
[9]Ferrero, A.; Pisani, U.: Two-port network analyzer calibration using an unknown “thru”. IEEE Microw. Guid. Wave Lett., 2 (12) (1992), 505–507.CrossRefGoogle Scholar
[10]Rosenberger, Calibration Kits & Verification Kits [Online]. http://www.rosenberger.com/Products, January 2013.Google Scholar
[11]Anritsu, 3656B W1 calibration/verification kit and 2300-496 system performance verification software- part number 10420-00286, Product Brochure, June 2009.Google Scholar
[12]Agilent Technologies, Agilent technologies 85059A 1.0 mm precision calibration and verification kit – operating and service manual part number 85059-90003, Application Note, August 2010.Google Scholar
[13]Blackham, D.; Wong, K.: Latest advances in VNA accuracy enhancements. Microw. J., 48 (2005), 78–94.Google Scholar
[14]Harris, I.A.: The theory and design of coaxial resistor mounts for the frequency band 0–4000 mc/s. Proc. IEE, 103 (3) (1956).Google Scholar
[15]Kohn, C.: The radio frequency coaxial resistor using a tractorial jacket. Proc. IRE, 43 (8) (1955), 951–960.CrossRefGoogle Scholar
[16]Woods, D.: Improvements in precision coaxial resistor design. IRE Trans. Instrum., I-11 (3) (1962), 305–309.CrossRefGoogle Scholar
[17]Hechtfischer, G.; Hohenester, W.; Huber, R.; Jünemann, R.; Pinta, C.; Völk, M.: Calibration unit for a measuring device. Patent WO/2012/034 803, March. 22, 2012.Google Scholar
[18]CST Microwave Studio, [Online]. http://www.cst.com, September 2013.Google Scholar
[19]ANSYS HFSS [Online]. http://www.hfss.com/products, September 2013.Google Scholar
[20]Hoffmann, J.; Leuchtmann, P.; Vahldieck, R.: Pin gap investigations for the 1.85 mm coaxial connector, in European Microwave Conference, October 2007, 388–391.CrossRefGoogle Scholar
[21]Rohde & Schwarz, [Online]. http://www.rohde-schwarz.com/en/zvaproductstartpage_63493-9660.html, Sep. 2013.Google Scholar