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High permeability and high permittivity heterostructures for the miniaturization of Radiofrequency components

Published online by Cambridge University Press:  07 January 2010

Evangéline Bènevent ,
Kevin Garello ,
Dominique Cros  and
Bernard Viala
Evangéline Bènevent*
Affiliation:
CEA, LETI, MINATEC, F38054 Grenoble, France. Phone: +334.38.78.02.75; Fax: +334.38.78.21.27. SPINTEC, CEA, CNRS, UJF, INPG; CEA/INAC, F38054 Grenoble, France.
Kevin Garello
Affiliation:
CEA, LETI, MINATEC, F38054 Grenoble, France. Phone: +334.38.78.02.75; Fax: +334.38.78.21.27. SPINTEC, CEA, CNRS, UJF, INPG; CEA/INAC, F38054 Grenoble, France. XLIM, CNRS, F87060 Limoges, France.
Dominique Cros
Affiliation:
XLIM, CNRS, F87060 Limoges, France.
Bernard Viala
Affiliation:
CEA, LETI, MINATEC, F38054 Grenoble, France. Phone: +334.38.78.02.75; Fax: +334.38.78.21.27. SPINTEC, CEA, CNRS, UJF, INPG; CEA/INAC, F38054 Grenoble, France.
*
Corresponding author: E. Bènevent Email: [email protected]
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Abstract

This paper discusses on the miniaturization of radiofrequency (RF) front-end components such as half-wavelength resonators based on new magneto-dielectric heterostructures combining high permeability (µ = 150–250) and high permittivity (ε = 18–150). Size reduction is evaluated by means of 2-cm-long coplanar waveguides realized with silicon technology and having a resonance frequency of about 3 GHz. The experimental results show a physical length reduction of 11.2% due to the dielectric contribution (ε = 18) and 14.8% by cumulating dielectric and magnetic effects (ε = 18 and µ = 150). These results are significant with respect to the moderate thickness of the preliminary material used here (only 150 nm). In a second part, a predictive model is proposed with µ and ε as variables. When adjusting the material properties in a realistic way (µ = 250 and ε = 150), the model predicts size reduction of ~50% for the same thickness. Larger values can be expected with increasing the film thickness.

Keywords

Magneto-dielectricPermeabilityPermittivityExchange couplingAnalytical modelingCoplanar waveguide
Type
Original Article
Information
International Journal of Microwave and Wireless Technologies , Volume 1 , Special Issue 6: 2009 National Microwave Days in France , December 2009 , pp. 455 - 460
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2010

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References

REFERENCES

[1]Garello, K.; Viala, B.; Bènevent, E.: Magnetic–dielectric heterostructure thin film combining high permeability and high permittivity, in IEEE International Magnetics Conference 2009, Sacramento, CA, 2009.Google Scholar
[2]Lamy, Y.; Viala, B.: Combination of ultimate magnetization and ultrahigh uniaxial anisotropy in CoFe-exchange multilayers. J. Appl. Phys., 97 (10) (2005), 10F910–10F913.CrossRefGoogle Scholar
[3]Guillian, J.; Tartavel, G.; Defay, E.; Ulmer, L.; Andre, B.; Baume, F.: Optimization of surface capacitance and leakage currents on ion beam sputtered SrTiO3-based MIM capacitors above IC technology. Integr. Ferroelectr., 67 (2004), 93–101.CrossRefGoogle Scholar
[4]Heinrich, W.: Quasi-TEM description of MMIC coplanar lines including conductor-loss effects. IEEE Trans. Microwave Theory Tech., 41 (1) (1993), 45–52.CrossRefGoogle Scholar
[5]Gilbert, T.L.: A Lagrangian formulation of gyromagnetic equation of the magnetic field. Phys. Rev., 10 (1955), 1243.Google Scholar
[6]Kittel, C.: On the theory of ferromagnetic resonance absorption. Phys. Rev., 73 (2) (1948), 155–161.CrossRefGoogle Scholar
[7]Aharoni, A.: Demagnetizing factors for rectangular ferromagnetic prisms. J. Appl. Phys., 83 (6) (1998), 3432–3434.CrossRefGoogle Scholar