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Design and analysis of response threshold of energy selective surface based on serial LC circuits

Published online by Cambridge University Press:  03 December 2024

Ning Hu
Affiliation:
Information Engineering University, Zhengzhou, China
Xi Zhu
Affiliation:
Information Engineering University, Zhengzhou, China
He Wang
Affiliation:
Information Engineering University, Zhengzhou, China
Haojie Yin
Affiliation:
Information Engineering University, Zhengzhou, China
Yanlin Xu*
Affiliation:
College of Electronic Science and Technology, National University of Defense Technology, Changsha, China
*
Corresponding author: Yanlin Xu; Email: [email protected]

Abstract

This paper presents a method to design the response threshold (RT) of energy selective surface (ESS) based on series LC circuits (SLC_based_ESS). A simple SLC_based_ESS structure composed of metal strips and PIN diodes is used for demonstration. According to our research, the RT is rarely related to the geometry parameters of unit cells. By contrast, the RT could be designed by introducing auxiliary structures (ASs) to SLC_based_ESS arrays. With the AS, the induced currents on diodes are enhanced and thus RT is greatly reduced. Prototypes are fabricated and measured under different power levels. The results agree well with simulations, proving an effective design of RT by the proposed method.

Type
Research Paper
Copyright
© The Author(s), 2024. Published by Cambridge University Press in association with The European Microwave Association.

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