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Evaluation of metrology technologies for free form surfaces

Published online by Cambridge University Press:  26 September 2012

K. Arámbula ,
H.R. Siller ,
L. De Chiffre ,
C.A. Rodríguez  and
A. Cantatore
K. Arámbula
Affiliation:
Centro de Innovación en Diseño y Tecnología, Tecnológico de Monterrey, Av. Eugenio Garza Sada #2501, 64849 Monterrey, Mexico
H.R. Siller*
Affiliation:
Centro de Innovación en Diseño y Tecnología, Tecnológico de Monterrey, Av. Eugenio Garza Sada #2501, 64849 Monterrey, Mexico
L. De Chiffre
Affiliation:
Department of Mechanical Engineering, Technical University of Denmark, 2800 Kgs. Lyngby, Denmark
C.A. Rodríguez
Affiliation:
Centro de Innovación en Diseño y Tecnología, Tecnológico de Monterrey, Av. Eugenio Garza Sada #2501, 64849 Monterrey, Mexico
A. Cantatore
Affiliation:
Department of Mechanical Engineering, Technical University of Denmark, 2800 Kgs. Lyngby, Denmark
*
⋆ Correspondence: [email protected]
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Abstract

This research work describes a novel approach for comparing different technologies forfree form surface metrology: computerized tomography (CT), photogrammetry and coordinatemeasuring machines (CMM). The comparison has the aim of providing relevant information forthe selection of metrology equipment when measuring free form components. Resultsdemonstrate that there is the imperative need to assess the uncertainty andreproducibility of CT and photogrammetry measurements by applying some calibrationprocedures taking into account some recommendations for work piece alignment. This articlealso deals with costs issues, required standards, and necessary additional informationwhen selecting inspection equipment.

Keywords

Freeformmetrologycomputed tomographyCMMphotogrammetry
Type
Research Article
Information
International Journal of Metrology and Quality Engineering , Volume 3 , Issue 1 , 2012 , pp. 55 - 62
Copyright
© EDP Sciences 2012

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