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Computer aided techniques for estimation and reduction ofelectromagnetic measurement devices uncertainties

Published online by Cambridge University Press:  17 December 2010

M. Cundeva-Blajer  and
L. Arsov
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Abstract

At non-linear electromagnetic measurement systems, the finite element method is the mostconvenient tool for the system analysis and measurement uncertainties budget estimation.Two non-linear devices will be analyzed by finite element method: electrical steel sheettesting device-Epstein frame and combined current-voltage instrument transformer. TheEpstein frame must comply with the standard IEC 60404-2:1996+A1:2008, and the combinedinstrument transformer with the IEC 60044-3: 2002. The Epstein frame forms an unloadedtransformer and the analytical transformer theory introduces some approximations. The mainapproximation is introduced by the standard IEC 60404-2 (through the presumption ofconstant, invariant to the specimen grade effective magnetic path length). The finiteelement method results will enable an Epstein frame and combined current-voltageinstrument transformer prototype design (by using a computer program based on geneticalgorithm with minimal uncertainty budget as goal function) with reduced measurementuncertainty, which will be experimentally verified in the Metrological Laboratory forElectromagnetic Quantities at the Faculty of Electrical Engineering and InformationTechnologies-Skopje.

Keywords

Uncertainties estimationinstrument transformerEpstein framefinite element methodgenetic algorithm
Type
Research Article
Information
International Journal of Metrology and Quality Engineering , Volume 1 , Issue 2 , 2010 , pp. 89 - 97
Copyright
© EDP Sciences 2010

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References

Références

T. Nakata, N. Takahashi, K. Fujiwara, M. Nakano, H. Ohashi, H.L. Zhu, 3-D Magnetic Field Analysis of Epstein Frame for Measuring Magnetic Characteristics, Electric and magnetic Fields (Plenum Press, New York, 1995), pp. 291–294
E. Lesniewska, W. Jalmuzny, Influence of the correlated location of cores of TPZ class protective current transformers on their transient state parameters, Studies in Applied Electromagnetics and Mechanics: Advanced Computer Techniques in Applied Electromagnetics, Vol. 30 (IOS Press, 2008), pp. 231–239
D. Filipovic-Grcic, M. Pljak, Z. Stih, Optimization of the paper-oil insulation of high voltage inverse current transformers using genetic algorithm, in Proc. of 13th Int. Symp. Electromagnetic Fields in Electrical Engineering ISEF, Prague, Czech Republic, 2007 (paper ID 065 on a CD ROM)
M. Samplon, J.S. Artal, A. Uson, F. Arcega, J. Letosa, Uncertainties associated with clamp-current meters. Analysis by the finite element method, Proc. of Int. Symp. Applied Electromagnetics and Mechanics ISEM, Paris, France, 2003, pp. 256–257
EN ISO/IEC (International Electrotechnical Commission) 60404-2, 1996+A1:2008: Magnetic Materials, Part 2: Methods of measurement of magnetic properties of electrical steel sheet and strip by means of an Epstein frame (Geneva, 2008)
M. Cundeva, L. Arsov, Experimental verification of the results from the FEM-3D magnetic field Analysis of Epstein Frame, Studies in Applied Electromagnetics and Mechanics, Vol. 22 (IOS Press Ohmsha, Amsterdam, 2002), pp. 379–384
Cundeva-Blajer, M., Arsov, L., FEM-3D Electromagnetic Field analysis coupled with genetic algorithm for measurement uncertainties estimation and optimal design of an instrument transformer, Int. J. Appl. Electromagn. Mech. 28, 25–31 (IOS Press, 2008)
EN ISO/IEC (International Electrotechnical Commission) 60044-3, Instrument transformers, Part 3: Combined transformers (Geneva, 2002)