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Measuring EUV Line Emission from the Hot Interstellar Medium

Published online by Cambridge University Press:  12 April 2016

Simon Labov ,
Christopher Martin  and
Stuart Bowyer
Simon Labov
Affiliation:
Space Sciences Laboratory, University of California, Berkeley
Christopher Martin
Affiliation:
Space Sciences Laboratory, University of California, Berkeley
Stuart Bowyer
Affiliation:
Space Sciences Laboratory, University of California, Berkeley

Abstract

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In the local interstellar medium, the presence of hot gas (log T ~ 5 to 6) has been inferred from measurements of oxygen VI absorption in the ultraviolet, and from diffuse emission in the extreme ultraviolet (EUV) and soft X-ray regions. Here we describe a spectrometer that is very sensitive to gas in this temperature range. The spectrometer uses an array of plane-ruled gratings at grazing incidence in the extreme off plane mount. A set of Kirkpatrick-Baez mirrors focuses the conically diffracted light on to one of two microchannel plate detectors. The field of view of the instrument is 0.2° by 12°. The predicted sensitivity ranges from 50 to 200 ph/(cm2 sec str) with a resolving power (λ/Δλ) of 15 to 50 over the 50 to 700A wavelength band. The instrument is currently under construction for a sounding rocket flight.

Type
Things To Come
Information
International Astronomical Union Colloquium , Volume 81: Local Interstellar Medium , 1984 , pp. 348 - 352
Copyright
Copyright © NASA 1984

References

Cash, W., Malina, R., and Stern, R. 1976, Ap. J. (Letters),204, L7.Google Scholar
Feldman, P. D., Brune, W. H., and Henry, R. C. 1981, Ap. J. (Letters),249, L51,CrossRefGoogle Scholar
Inoue, H., Royama, K., Matsuoke, M., Onashi, T., and Tanaka, Y. 1979, Ap. J. (Letters),227, L85.Google Scholar
Kimble, Randy 1983,PhD. Thesis, “Observations of the EUV/FUV Radiation fields,” University of California, Berkeley.Google Scholar
Martin, C., Jelinsky, P., Lampton, M., Malina, R.F., and Anger, H.O. 1981, Rev. Sei. Instrum., 52, 1067.Google Scholar
Martin, C. and Bowyer, S. 1982, Applied Optics 21, 4206.CrossRefGoogle Scholar
Paresce, R. and Bowyer, S. 1976, Ap. J.,207, 432.Google Scholar
Paresce, F., Monsignori Fossi, B. C., and Landini, M. 1983, Ap. J. (Letters), 266, L107.Google Scholar
Paresce, F. and Stern, R. 1981, Ap. J., 247, 89.Google Scholar
Raymond, John C. and Smith, Barhem W. 1977, Ap. J. Suppl.,35,419.Google Scholar
Sandel, B. R., Shemansky, D. E., and Broadfoot, A. L. 1979, Ap. J.,227, 808.Google Scholar
Stern, R. and Bowyer, S. 1979, Ap. J., 230, 755.Google Scholar
Stern, R., Wang, E., and Bowyer, S. 1978, Ap. J. Suppl.,37,195.Google Scholar