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Interferometric Techniques Applied to High Resolution Observation of the Solar Granulation

Published online by Cambridge University Press:  02 August 2016

Claude Aime*
Affiliation:
Astrophysics Department, I.M.S.P., Parc Valrose, University of Nice, France

Abstract

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Michelson,one-dimensional, and two-dimensional apertures are used to obtain the statistical properties of the solar granulation. The calibration of the power spectrum is performed via Michelson stellar interferometry as well as by the use of changes in seeing conditions during speckle-interferometric measurements. The correction of 40 analyses, determined with Fried's parameter ro ranging between 2.5 cm and 11.5 cm, provides satisfactory convergence for frequencies up to 3 cycles per arc second

Type
The Scientific Programme
Copyright
Copyright © 1979

References

1) Beckers, J.M. and Parnell, R.L., Solar Phys., 9, 39, 1969.Google Scholar
2) Karpinsky, V.N. and Meckanikov, V.V., Solar Phys., 54, 25, 1977.Google Scholar
3) Wittmann, A. and Mehltretter, J.O., Astron. Astrophys., 61, 75, 1977.Google Scholar
4) Aime, C., Ricort, G. and Grec, G., Astron. Astrophys., 54, 505, 1977 Google Scholar
5) Korff, D., J. Opt. Soc. Am., 63, 971, 1973.Google Scholar
6) Roddier, C. and Roddier, F., J. Opt. Soc. Am., 66, 6,1976.Google Scholar
7) Aime, C. and Roddier, F., Optics Commun., 19, 57, 1976.Google Scholar
8) Aime, C., Optics Commun., 26, 139, 1978.CrossRefGoogle Scholar
9) Aime, C., Ricort, G. and Harvey, J., Ap. J, 221, 362, 1978.CrossRefGoogle Scholar
10) Roddier, F., J. Opt Soc. Am., 65, 664, 1975.Google Scholar
11) Aime, C. and Roddier, F., Optics Commun., 21, 435, 1977.Google Scholar
12) Aime, C., Ricort, G., Roddier, C. and Lago, G., to be published in J. Opt. Soc. Am.Google Scholar