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Dispersive Spectroscopy on AXAF

Published online by Cambridge University Press:  12 April 2016

T.H. Markert
T.H. Markert*
Affiliation:
Massachusetts Institute of Technology, Cambridge, MA, USA

Abstract

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There are two transmission grating spectrometers and one Bragg crystal spectrometer being developed for the Advanced X-ray Astrophysics Facility (MIT is building the crystal spectrometer and one of the grating spectrometers; the Laboratory for Space Research in Utrecht is responsible for the other grating spectrometer). The gratings divide the AXAF energy band (80 eV – 10 keV) into three regions (the MIT instrument contains gratings with two different periods) and attain resolving powers for point sources between 100 and 1800. The gratings are composed of arrays of small facets mounted on plates which can be inserted immediately behind the AXAF telescope. The dispersed spectra from the grating arrays are read out by one of the AXAF imaging instruments.

The Bragg Crystal Spectrometer (BCS) is a focal plane instrument. One of eight selectable curved diffractors intercepts the AXAF X-ray beam as it diverges beyond the focal point X-rays that satisfy Bragg’s law are reflected from the crystal which, because of its curvature, re-focuses the beam onto an imaging detector. Narrow spectral regions are scanned by rocking the crystal over a range ~0.1 to 1°. Nearly the entire AXAF energy range can be studied by selecting the appropriate crystal and rotating it to the proper Bragg angle. The BCS achieves the highest spectral resolutions of the AXAF spectrometers: for 500 eV < E < 1600 eV, the FWHM of a narrow line (ΔE) is ≲ 1 eV.

Type
9. Future X-ray Observatories, Detectors and Instrumentation
Information
International Astronomical Union Colloquium , Volume 115: High Resolution X-ray Spectroscopy of Cosmic Plasmas , 1990 , pp. 339 - 345
Copyright
Copyright © Cambridge University Press 1990

References

Beuermann, K.P, Brauninger, H., and Trumper, J. 1978, Appl. Optics,17, 2304.CrossRefGoogle Scholar
Brinkman, A.C., van Rooijen, J.J., Bleeker, J.A.M., Dijkstra, J.H., Heise, J., de Korte, P.A.J., Mewe, R., and Paerels, F. 1985, Proc. SPIE,597,232.CrossRefGoogle Scholar
Canizares, C.R., Markert, T.H., and Clark, G.W. 1985, Proc. SPIE 597, 241.Google Scholar
Canizares, C.R., Schattenburg, M.L., and Smith, H.I. 1985, Proc. SPIE,597,253.Google Scholar
Markert, T.H., Powers, T.R., Levine, A.M., McCullum, C.B., Mohr, J.J. and Canizares, C.R. 1988, Proc. SPIE,982, in press.Google Scholar
Schattenburg, M.L., Canizares, C.R., Dewey, D., Levine, A.M., Markert, T.H. and Smith, H.I. 1988, Proc. SPIE, 982, in press.Google Scholar
Schnopper, H.W., Delvaille, J.P., Epstein, A., Kalata, K. and Sohval, R. 1976, Space Science Instrumentation,2,243.Google Scholar