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A Compact SIS Receiver Cooled By 4 K GM Refrigerator

Published online by Cambridge University Press:  12 April 2016

Toru Kuriyama
Affiliation:
Toshiba Research and Development CenterUkishima-cho, Kawasaki-ku, Kawasaki, Kanagawa, 210, Japan
Hideo Hatakeyama
Affiliation:
Toshiba Research and Development CenterUkishima-cho, Kawasaki-ku, Kawasaki, Kanagawa, 210, Japan
Masahiko Takahashi
Affiliation:
Toshiba Research and Development CenterUkishima-cho, Kawasaki-ku, Kawasaki, Kanagawa, 210, Japan
Hideki Nakagome
Affiliation:
Toshiba Research and Development CenterUkishima-cho, Kawasaki-ku, Kawasaki, Kanagawa, 210, Japan
Ryohei Kawabe
Affiliation:
Nobeyama Radio Observatory Nobeyama, Minamimaki, Minamisaku, Nagano, 384-13, Japan
Hiroyuki Iwashita
Affiliation:
Nobeyama Radio Observatory Nobeyama, Minamimaki, Minamisaku, Nagano, 384-13, Japan
Gerrard McCulloch
Affiliation:
Nobeyama Radio Observatory Nobeyama, Minamimaki, Minamisaku, Nagano, 384-13, Japan
Katsunori Shibata
Affiliation:
Nobeyama Radio Observatory Nobeyama, Minamimaki, Minamisaku, Nagano, 384-13, Japan
Nobuharu Ukita
Affiliation:
Nobeyama Radio Observatory Nobeyama, Minamimaki, Minamisaku, Nagano, 384-13, Japan

Extract

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SIS receivers have higher sensitivity than Schottky diode receivers. The SIS mixer, however, must be cooled at 4 K level, and either a GM (Gifford-McMahon) + JT (Joule- Thomson) refrigerator or liquid helium is used. Therefore, SIS receivers are usually much larger and heavier than Schottky diode receivers which are usually cooled by a GM refrigerator only.

Kuriyama et al. developed a GM refrigerator using Er3Ni as a regenerator material which achieved to cool at 4 K level.

In this work, the SIS receiver was constructed and investigated, which was cooled below 4 K by the GM refrigerator with Er3Ni. It resulted in the SIS receiver which was about the same size and weight as a usual Schottky diode receiver.

Type
2. Technical Innovations
Copyright
Copyright © Astronomical Society of the Pacific 1994

References

(1) Kuriyama, T. et al., Jpn. J. Appl. Phys. 31 (1989), p.1206.CrossRefGoogle Scholar