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Rapid estimation of porosity and mineral abundance in backscattered electron images using a simple SEM image analyser

Published online by Cambridge University Press:  01 May 2009

K. Pye
K. Pye
Affiliation:
Department of Earth Sciences, Downing Street, Cambridge CB2 3EQ
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Abstract

Image analysis is rapidly becoming an integral part of scanning electron microscopy. A number of analogue and digital image analysis systems of varying sophistication are now commercially available for the SEM. This paper illustrates how one such relatively simple system, the IMAS image analyser manufactured by Cambridge Technology, can be used to obtain rapid quantitative estimates of porosity and mineral abundance in backscattered electron images of polished rock sections.

Type
Articles
Information
Geological Magazine , Volume 121 , Issue 2 , March 1984 , pp. 81 - 84
Copyright
Copyright © Cambridge University Press 1984

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