KRINSLEY, D. H., PYE, K., BOGGS, S., JR &amp; TOVEY, N. K. 1998. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. ix+193 pp. Cambridge, New York, Melbourne: Cambridge University Press. Price £50.00, US $80.00 (hard covers). ISBN 0 521 45346 1.

Anton Kearsley

doi:10.1017/S0016756801235596

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KRINSLEY, D. H., PYE, K., BOGGS, S., JR & TOVEY, N. K. 1998. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. ix+193 pp. Cambridge, New York, Melbourne: Cambridge University Press. Price £50.00, US $80.00 (hard covers). ISBN 0 521 45346 1.

Volume 138, Issue 4
Anton Kearsley
DOI: https://doi.org/10.1017/S0016756801235596

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KRINSLEY, D. H., PYE, K., BOGGS, S., JR & TOVEY, N. K. 1998. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. ix+193 pp. Cambridge, New York, Melbourne: Cambridge University Press. Price £50.00, US $80.00 (hard covers). ISBN 0 521 45346 1.

Volume 138, Issue 4
Anton Kearsley
DOI: https://doi.org/10.1017/S0016756801235596

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KRINSLEY, D. H., PYE, K., BOGGS, S., JR & TOVEY, N. K. 1998. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. ix+193 pp. Cambridge, New York, Melbourne: Cambridge University Press. Price £50.00, US $80.00 (hard covers). ISBN 0 521 45346 1.

Volume 138, Issue 4
Anton Kearsley
DOI: https://doi.org/10.1017/S0016756801235596

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KRINSLEY, D. H., PYE, K., BOGGS, S., JR & TOVEY, N. K. 1998. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. ix+193 pp. Cambridge, New York, Melbourne: Cambridge University Press. Price £50.00, US $80.00 (hard covers). ISBN 0 521 45346 1.

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KRINSLEY, D. H., PYE, K., BOGGS, S., JR & TOVEY, N. K. 1998. Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks. ix+193 pp. Cambridge, New York, Melbourne: Cambridge University Press. Price £50.00, US $80.00 (hard covers). ISBN 0 521 45346 1.

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