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J. R. Rhodes, C. S. Barrett, D. E. Leyden, J. B. Newkirk, P. K. Predecki & C. O. Ruud (eds) 1980. Advances in X-Ray Analysis. Volume 23. Proceedings of the twenty-eighth Annual Conference on Applications of X-Ray Analysis held in Denver, July 30–August 3, 1979. New York, London: Plenum Press. 408 pp., numerous illustrations. Price US $45.00 (USA); $54.00 elsewhere ISBN 0 306 40435 4.
Published online by Cambridge University Press: 01 May 2009
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