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J. I. Golstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori & E. Lifshin 1981. Scanning Electron Microscopy and X-Ray Microanalysis. xiii + 673 pp., numerous illustrations. New York, London: Plenum. Price U.S. $29.50 (U.S.A.); plus 20% elsewhere. ISBN 0 306 40768 X.
Published online by Cambridge University Press: 01 May 2009
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- Copyright © Cambridge University Press 1982