No CrossRef data available.
Article contents
X-ray diffraction study of a Si Σ13 symmetric tilt grain boundary
Published online by Cambridge University Press: 01 November 2010
Abstract
We present an X-ray diffraction study of a semiconductor symmetric tilt grain boundary. The theory of crystal truncation rod scattering is extended to bicrystal interfaces and compared with experimental data measured at the Diamond Light Source.
- Type
- Poster paper
- Information
- Copyright
- Copyright © Diamond Light Source Ltd 2010