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X-ray diffraction study of a Si Σ13 symmetric tilt grain boundary

Published online by Cambridge University Press:  01 November 2010

S. D. Rhead ,
P. B. Howes ,
M. Roy ,
J. L. Rawle ,
C. Nicklin  and
C. Norris
S. D. Rhead
Affiliation:
Department of Physics and Astronomy, University of Leicester, Leicester LE1 7RH, UK
P. B. Howes*
Affiliation:
Department of Physics and Astronomy, University of Leicester, Leicester LE1 7RH, UK
M. Roy
Affiliation:
Department of Physics and Astronomy, University of Leicester, Leicester LE1 7RH, UK
J. L. Rawle
Affiliation:
Diamond Light Source, Diamond House Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK
C. Nicklin
Affiliation:
Diamond Light Source, Diamond House Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK
C. Norris
Affiliation:
Diamond Light Source, Diamond House Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK
*
†Email address for correspondence:[email protected]
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Abstract

We present an X-ray diffraction study of a semiconductor symmetric tilt grain boundary. The theory of crystal truncation rod scattering is extended to bicrystal interfaces and compared with experimental data measured at the Diamond Light Source.

Type
Poster paper
Information
Diamond Light Source Proceedings , Volume 1 , Issue SRMS-7 , October 2010 , e110
Copyright
Copyright © Diamond Light Source Ltd 2010

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References

REFERENCES

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