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Valence band of Co/Cu thin film studied with synchrotron radiation photoemission spectroscopy

Published online by Cambridge University Press:  01 March 2011

Soma Banik ,
S. K. Deb ,
S. Barman ,
G. P. Das ,
D. M. Phase  and
S. K. Rai
Soma Banik*
Affiliation:
Raja Ramanna Centre for Advanced Technology, Indore 452013, India
S. K. Deb
Affiliation:
Raja Ramanna Centre for Advanced Technology, Indore 452013, India
S. Barman
Affiliation:
Indian Association for the Cultivation of Science, Kolkata 700032, India
G. P. Das
Affiliation:
Indian Association for the Cultivation of Science, Kolkata 700032, India
D. M. Phase
Affiliation:
UGC-DAE Consortium for Scientific Research, Indore 452001, India
S. K. Rai
Affiliation:
Raja Ramanna Centre for Advanced Technology, Indore 452013, India
*
†Email address for correspondence:[email protected]
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Abstract

The electronic structure of Co (100 Å)/Cu (50 Å) bilayer film on Si(100) has been investigated using valence band photoemission at 50 eV. The aim is to understand the Co/Cu interface and the nature of intermixing in Co and Cu layers. The valence band of Co/Cu interface shows three features at −0.3, −1.17 and −1.9 eV binding energy. The experimental observations are explained with the help of calculations based on projected augmented wave pseudopotential method using density functional theory. The origin of −0.3 eV feature is mainly due to the Co 3d minority spin states while the features at −1.17 and −1.9 eV are due to the formation of Co and Co–Cu mixed nanoclusters at the interface.

Type
Poster paper
Information
Diamond Light Source Proceedings , Volume 1 , Issue SRMS-7 , October 2010 , e137
Copyright
Copyright © Diamond Light Source Ltd 2011

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References

REFERENCES

Chaudhari, S. M., Phase, D. M., Wadikar, A. D., Dasannacharya, B. A., Ramesh, G. S. & Hegde, H. S. 2002 Photoelectron spectroscopy beamline on Indus-1 synchrotron radiation source. Curr. Sci. 82, 305.Google Scholar
Christides, C., Stavroyiannis, S., Kallias, G., Nassiopoulou, A. G. & Niarchos, D. 1999 Giant magnetoresistance Co/Cu multilayer sensors for use in magnetic field mapping. Sens. Actu. 76, 167.CrossRefGoogle Scholar
Eastman, D. E. 1969 Photoemission studies of the electronic structure of transition metals. J. Appl. Phys. 40, 1387.Google Scholar
Nouvertne, F., May, U., Bamming, M., Rampe, A., Korte, U., Guntherodt, G., Pentcheva, R. & Scheffler, M. 1999 Atomic exchange processes and bimodal initial growth of Co/Cy(001). Phys. Rev. B 60, 14382.CrossRefGoogle Scholar
Parkin, S. S. P., Li, Z. G. & Smith, D. J. 1991 Giant magnetoresistance in antiferromagnetic Co/Cu miltiyalyer. Appl. Phys. Lett. 58, 2710.CrossRefGoogle Scholar
Pentcheva, R. & Scheffler, M. 2002 Initial adsorption of Co on Cu(001): A first-principles investigation. Phys. Rev. B 65, 155418.CrossRefGoogle Scholar