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Reflected extended X-ray absorption fine structure study of the surface region of layered samples
Published online by Cambridge University Press: 14 January 2011
Abstract
We present preliminary reflection extended X-ray absorption fine structure results on reactive magnetron sputtering molybdenum nitride (MoN) layered samples, with different compositions and surface layer thickness. The results obtained over a wide range of incidence angles show significant differences between two samples where the outer layer is either Mo metal or MoN.
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- Copyright © Diamond Light Source Ltd 2011