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Element-specific high-resolution diffraction microscopy using focused hard X-ray beam

Published online by Cambridge University Press:  01 March 2011

Y. Takahashi ,
Y. Nishino ,
R. Tsutsumi ,
N. Zettsu ,
K. Yamauchi ,
T. Ishikawa  and
E. Matsubara
Y. Takahashi*
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
Y. Nishino
Affiliation:
Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0021, Japan
R. Tsutsumi
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
N. Zettsu
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
K. Yamauchi
Affiliation:
Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
T. Ishikawa
Affiliation:
RIKEN SPring-8 Center, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
E. Matsubara
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Yoshida, Sakyo, Kyoto 606-8501, Japan
*
†Email address for correspondence: [email protected]
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Abstract

We demonstrated high-resolution element-specific diffraction microscopy using a hard X-ray beam focused by Kirkpatrick–Baez mirrors. Coherent diffraction patterns of an Au/Ag nanoparticle were measured at incident X-ray energies around the Au LIII absorption edge. By calculating the difference between the intensities of reconstructed images obtained at different energies, an image of the Au element could be derived. From the difference image, it was suggested that the replacement reaction progresses from the corners of Ag cubic particle.

Type
Contributed paper
Information
Diamond Light Source Proceedings , Volume 1 , Issue SRMS-7 , October 2010 , e136
Copyright
Copyright © Diamond Light Source Ltd 2011

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References

REFERENCES

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