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Transmission Electron Microscopy of Fine-Grained Phyllosilicates in Ultra-Thin Rock Sections

Published online by Cambridge University Press:  01 July 2024

P. P. Phakey ,
C. D. Curtis  and
G. Oertel
P. P. Phakey*
Affiliation:
Department of Geology, University of California, Los Angeles, Calif. 90024, U.S.A.
C. D. Curtis*
Affiliation:
Department of Geology, University of California, Los Angeles, Calif. 90024, U.S.A.
G. Oertel
Affiliation:
Department of Geology, University of California, Los Angeles, Calif. 90024, U.S.A.
*
*Department of Physics, University of California, Berkeley. (Permanent address: Department of Physics, Monash University, Melbourne, Australia.)
†Permanent address: Department of Geology, The University, Sheffield S1 3JD, England.
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Abstract

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A method is described for preparing electron-transparent sections of fine-grained argillaceous rocks suitable for making transmission micrographs. A sediment and a slate are used as examples. Sections perpendicular to bedding or cleavage yield diffraction patterns with clearly defined 00l reflections. These allow immediate identification of 7, 10 and 14 Å structures. The combination of detailed textural information with structural identification of individual phyllosilicate particles affords a powerful method for the investigation of late diagenetic and early metamorphic changes in sediments.

Résumé

Résumé

On décrit une méthode pour préparer, à partir de roches argileuses à grain fin, des coupes transparentes aux électrons adaptées à la micrographie par transmission. On prend comme exemples un sédiment et une ardoise. Des coupes perpendiculaires à la stratification ou au clivage donnent des diagrammes de diffraction comportant des réflexions 00l clairement définies. Ces réflexions permettent l’identification immédiate des structures à 7, 10 et 14 Å. La combinaison d’une information texturale détaillée et de l’identification de la structure des particules individuelles de phyllosilicate constitue une méthode puissante dans l’étude des modifications subies par les sédiments à la suite d’une diagenèse avancée et d’un métamorphisme faible.

Kurzreferat

Kurzreferat

Es wird eine Methode beschrieben für die Herstellung elektronentransparenter Schnitte feinkörniger Tongesteine, die geeignet sind für die Erzeugung von Transmissionsmikrographien. Als Beispiele werden ein Sediment und ein Schiefer verwendet. Schnitte in Normalrichtung zum Lager oder Spalt ergeben Beugungsbilder mit klar definierten 00l Reflexionen. Diese gestatten unmittelbare Identifizierung von 7, 10 und 14 Å Gefügen. Die Kombination detaillierter Information über das Gefüge mit struktureller Identifizierung individualler Phyllosilikatteilchen ergibt eine wirksame Methode für die Untersuchung spät diagenetischer und früh metamorphischer Veränderungen in Sedimenten.

Резюме

Резюме

Описывается метод приготовления «прозрачных» для электронов шлифов тонкозернистых глинистых пород пригодных для электронномикроскопических снимков в проходящем пучке. Для примера применялись осадок и сланец. Профили перпендикулярные к наслоению или сланцеватости дали диффракционную картину с ясно выраженными отражениями 00l-го порядка, которые допускают непосредственную идентификацию структур 7, 10 и 14 Å. Это сочетание детальной информации о текстуре со структурной идентификацией индивидуальных частиц филлосиликата представляет отличный метод для изучения последних диагенетических и ранних метаморфических изменений в осадках.

Type
Research Article
Information
Clays and Clay Minerals , Volume 20 , Issue 4 , August 1972 , pp. 193 - 197
Copyright
Copyright © Clay Minerals Society 1972

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