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Measurement of Fundamental Illite Particle Thicknesses by X-Ray Diffraction Using PVP-10 Intercalation

Published online by Cambridge University Press:  28 February 2024

D. D. Eberl ,
R. Nüesch ,
V. Sucha  and
S. Tsipursky
D. D. Eberl
Affiliation:
U.S. Geological Survey, 3215 Marine Street, Boulder, Colorado 80303
R. Nüesch
Affiliation:
ETH, IGT-ClayLab, Institut für Geotechnik, Sonneggstrasse 5, CH-8092 Zürich, Switzerland
V. Sucha
Affiliation:
Dept. of Geology of Mineral Deposits, Comenius University, Mlynská Dolina G, 842 15 Bratislava, Slovakia
S. Tsipursky
Affiliation:
Nanocor, 1350 W. Shure Drive, Arlington Heights, Chicago, Illinois
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Abstract

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The thicknesses of fundamental illite particles that compose mixed-layer illite-smectite (I-S) crystals can be measured by X-ray diffraction (XRD) peak broadening techniques (Bertaut-Warren-Averbach [BWA] method and integral peak-width method) if the effects of swelling and XRD background noise are eliminated from XRD patterns of the clays. Swelling is eliminated by intercalating Na-saturated I-S with polyvinylpyrrolidone having a molecular weight of 10,000 (PVP-10). Background is minimized by using polished metallic silicon wafers cut perpendicular to (100) as a substrate for XRD specimens, and by using a single-crystal monochromator. XRD measurements of PVP-intercalated diagenetic, hydrothermal and low-grade metamorphic I-S indicate that there are at least 2 types of crystallite thickness distribution shapes for illite fundamental particles, lognormal and asymptotic; that measurements of mean fundamental illite particle thicknesses made by various techniques (Bertant-Warren-Averbach, integral peak width, fixed cation content, and transmission electron microscopy [TEM]) give comparable results; and that strain (small differences in layer thicknesses) generally has a Gaussian distribution in the log-normal-type illites, but is often absent in the asymptotic-type illites.

Keywords

BertautFundamental Illite ParticlesIlliteIllite-SmectiteMixed-LayeringPeak BroadeningPolyvinylpyrrolidoneWarren-AverbachX-ray Diffraction
Type
Research Article
Information
Clays and Clay Minerals , Volume 46 , Issue 1 , February 1998 , pp. 89 - 97
Copyright
Copyright © 1998, The Clay Minerals Society

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