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Measurement of Fundamental Illite Particle Thicknesses by X-Ray Diffraction Using PVP-10 Intercalation

Published online by Cambridge University Press:  28 February 2024

D. D. Eberl
Affiliation:
U.S. Geological Survey, 3215 Marine Street, Boulder, Colorado 80303
R. Nüesch
Affiliation:
ETH, IGT-ClayLab, Institut für Geotechnik, Sonneggstrasse 5, CH-8092 Zürich, Switzerland
V. Sucha
Affiliation:
Dept. of Geology of Mineral Deposits, Comenius University, Mlynská Dolina G, 842 15 Bratislava, Slovakia
S. Tsipursky
Affiliation:
Nanocor, 1350 W. Shure Drive, Arlington Heights, Chicago, Illinois
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Abstract

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The thicknesses of fundamental illite particles that compose mixed-layer illite-smectite (I-S) crystals can be measured by X-ray diffraction (XRD) peak broadening techniques (Bertaut-Warren-Averbach [BWA] method and integral peak-width method) if the effects of swelling and XRD background noise are eliminated from XRD patterns of the clays. Swelling is eliminated by intercalating Na-saturated I-S with polyvinylpyrrolidone having a molecular weight of 10,000 (PVP-10). Background is minimized by using polished metallic silicon wafers cut perpendicular to (100) as a substrate for XRD specimens, and by using a single-crystal monochromator. XRD measurements of PVP-intercalated diagenetic, hydrothermal and low-grade metamorphic I-S indicate that there are at least 2 types of crystallite thickness distribution shapes for illite fundamental particles, lognormal and asymptotic; that measurements of mean fundamental illite particle thicknesses made by various techniques (Bertant-Warren-Averbach, integral peak width, fixed cation content, and transmission electron microscopy [TEM]) give comparable results; and that strain (small differences in layer thicknesses) generally has a Gaussian distribution in the log-normal-type illites, but is often absent in the asymptotic-type illites.

Type
Research Article
Copyright
Copyright © 1998, The Clay Minerals Society

References

Altaner, S.P. Weiss, C.A. Jr and Kirkpatrick, R.J., 1988 Evidence from 29Si NMR for the structure of mixed-layer illite/smectite clay minerals Nature 331 699702 10.1038/331699a0.CrossRefGoogle Scholar
Árkai, P. Merriman, R. Roberts, B. Peacor, D. and Tóth, M., 1996 Crystallinity, crystallite size and lattice strain of illite-mus-covite and chlorite: comparison of XRD and TEM data for diagenetic to epizonal pelites Eur J Mineral 8 11191137 10.1127/ejm/8/5/1119.CrossRefGoogle Scholar
Beall, G. Tsipursky, S. Sororcin, A. and Goldman, A., 1996 Intercalates and exfoliates formed with oligomers and polymers and composite materials containing same US Patent .Google Scholar
Beall, G. Tsipursky, S. Sororcin, A. and Goldman, A., 1996 Intercalates; exfoliates; process for manufacturing intercalates and exfoliates and composite materials containing same US Patent .Google Scholar
Delhez, R. de Keijser, T. and Mittemeijer, E.J., 1982 Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis Anal Chem 312 116 10.1007/BF00482725.CrossRefGoogle Scholar
Drits, V.A. Eberl, D.D. and Środoń, J., 1998 XRD measurement of mean thickness, thickness distribution and strain for illite and illite-smectite crystallites by the Bertaut-Warren-Av-erbach technique Clays Clay Miner 46 3850 10.1346/CCMN.1998.0460105.CrossRefGoogle Scholar
Drits, V.A. Środoń, J. and Eberl, D.D., 1997 XRD measurement of mean crystallite thickness of illite and illite/smectite: Reappraisal of the Kubler index and the Scherrer equation Clays Clay Miner 45 461475 10.1346/CCMN.1997.0450315.CrossRefGoogle Scholar
Eberl, D.D. Blum, A., Reynolds, R.C. Jr and Walker, J.R., 1993 Illite crystallite thickness by X-ray diffraction CMS Workshop Lectures, Vol. 5, Computer applications to X-ray powder diffraction analysis of clay minerals Boulder, CO Clay Miner Soc. 124153.Google Scholar
Eberl, D.D. Drits, V. Środoń, J. and Nüesch, R., 1996 MudMaster: A program for calculating crystallite size distributions and strain from the shapes of X-ray diffraction peaks U.S. Geol Surv Open File Report 96171.CrossRefGoogle Scholar
Eberl, D.D. Środoń, J. Lee, M. Nadeau, P.H. and Northrop, H.R., 1987 Sericite from the Silverton caldera, Colorado: Correlation among structure, composition, origin, and particle thickness Am Mineral 72 914934.Google Scholar
Eberl, D.D. Środoń, J. Kralik, M. Taylor, B. and Peterman, Z.E., 1990 Ostwald ripening of clays and metamorphic minerals Science 248 474477 10.1126/science.248.4954.474.CrossRefGoogle Scholar
Francis, C.W., 1973 Adsorption of polyvinylpyrrolidone on reference clay minerals Soil Sci 115 4054 10.1097/00010694-197301000-00007.CrossRefGoogle Scholar
Hunziker, J.C. Frey, M. Clauer, N. Dallmeyer, R.D. Friedrichsen, H. Flehmig, W. Hochstrasser, K. Roggwiler, P. and Schwander, H., 1986 The evolution of illite to muscovite: Mineralogical and isotopic data from the Glarus Alps, Switzerland Contrib Mineral Petrol 91 157180 10.1007/BF00375291.CrossRefGoogle Scholar
Khoury, H.N. and Eberl, D., 1981 Montmorillonite from the Amar-gosa Desert, southern Nevada U.S.A. N Jb Miner Abh 141 134141.Google Scholar
Li, C.-T. and Albe, W.R., 1993 Development of an improved XRD sample holder Powder Diffraction 8 118121 10.1017/S0885715600017942.CrossRefGoogle Scholar
Lindgreen, H. Garnaes, J. Hansen, P.L. Besenbacher, F. Laaegs-gaard, E. Stensgaard, I. Gould, S.A.C. and Hansma, P.K., 1991 Ultrafine particles of North Sea illite/smectite clay minerals investigated by STM and AFM Am Mineral 76 12181222.Google Scholar
Merriman, R.J. Roberts, B. and Peacor, D.R., 1990 A transmission electron microscope study of white mica crystallite size distribution in a mudstone to slate transitional sequence, North Wales, UK Contrib Mineral Petrol 106 2740 10.1007/BF00306406.CrossRefGoogle Scholar
Moore, D.M. and Reynolds, R.C. Jr., 1989 X-ray diffraction and the identification of clay minerals New York Oxford Univ Pr..Google Scholar
Nadeau, P.H. Tait, J.M. McHardy, W.J. and Wilson, M.J., 1984 Interstratified XRD characteristics of physical mixtures of elementary clay particles Clay Miner 19 6776 10.1180/claymin.1984.019.1.07.CrossRefGoogle Scholar
Nadeau, P.H. Wilson, M.J. McHardy, W.J. and Tait, J.M., 1984 Interstratified clay as fundamental particles Science 225 923935 10.1126/science.225.4665.923.CrossRefGoogle Scholar
Nadeau, P.H. Wilson, M.J. McHardy, W.J. and Tait, J.M., 1984 Interparticle diffraction: A new concept for interstratified clays Clay Miner 19 757759 10.1180/claymin.1984.019.5.06.CrossRefGoogle Scholar
Reynolds, R.C. Jr., 1985 NEWMOD©, A computer program for the calculation of one-dimensional diffraction patterns of mixed-layered clays .Google Scholar
Srodori, J., 1980 Precise identification of illite/smectite inter-stratifications by X-ray powder diffraction Clays Clay Miner 28 401411 10.1346/CCMN.1980.0280601.Google Scholar
Srodori, J., 1984 X-ray diffraction of illitic materials Clays Clay Miner 32 337349 10.1346/CCMN.1984.0320501.Google Scholar
Środoń, J. and Elsass, F., 1994 Effect of the shape of fundamental particles on XRD characteristics of illitic minerals Eur J Mineral 6 113122 10.1127/ejm/6/1/0113.CrossRefGoogle Scholar
Środoń, J. Elsass, F. McHardy, W.J. and Morgan, D.J., 1992 Chemistry of illite-smectite inferred from TEM measurements of fundamental particles Clay Miner 27 137158 10.1180/claymin.1992.027.2.01.CrossRefGoogle Scholar
Sucha, V. Srodon, J. Elsass, F. and McHardy, W.J., 1996 Particle shape versus coherent scattering domain of illite/smectite: evidence from HRTEM of Dolná Ves clays Clays Clay Miner 44 665671 10.1346/CCMN.1996.0440509.CrossRefGoogle Scholar