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Influence of the Outer Surface Layers of Crystals on the X-Ray Diffraction Intensity of Basal Reflections

Published online by Cambridge University Press:  01 January 2024

Boris A. Sakharov ,
Alain Plançon ,
Bruno Lanson  and
Victor A. Drits
Boris A. Sakharov
Affiliation:
Geological Institute Russian Academy of Sciences, 7 Pyzhevsky Street, 119017 Moscow, Russia
Alain Plançon
Affiliation:
Crystallography Laboratory, ISTO, University of Orléans — CNRS, 45067 Orléans Cedex 2, France
Bruno Lanson*
Affiliation:
Environmental Geochemistry Group, LGIT — Maison des GéoSciences, CNRS — University of Grenoble, 38041 Grenoble Cedex 9, France
Victor A. Drits
Affiliation:
Geological Institute Russian Academy of Sciences, 7 Pyzhevsky Street, 119017 Moscow, Russia
*
*E-mail address of corresponding author: [email protected]
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Abstract

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This study presents a mathematical formalism describing diffraction effects from periodic and mixed-layer minerals in which the outer surface layers of crystals possibly differ from layers forming the core of the crystals. The X-ray diffraction (XRD) patterns calculated for structure models of chlorite and irregular chlorite-smectites terminated on both sides of the crystals by either brucite-like sheets or 2:1 layers show the strong influence that different outer surface layers have on the distribution of basal reflection intensities. Simulation of the experimental XRD patterns from two chlorite samples having different Fe contents shows that in these two samples the chlorite crystals were terminated by brucite-like sheets on both sides. In contrast, crystals in a corrensite sample were terminated by water molecules and exchangeable cations. The nature of diffraction effects due to outer surface layers is discussed.

Keywords

Basal ReflectionsBrucite SheetsChloriteCorrensiteMixed-layer StructuresOuter Surface LayersXRD
Type
Research Article
Information
Clays and Clay Minerals , Volume 52 , Issue 6 , December 2004 , pp. 680 - 692
Copyright
Copyright © 2004, The Clay Minerals Society

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