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Identification of Neoformed Ni-Phyllosilicates Upon Ni Uptake in Montmorillonite: A transmission Electron Microscopy and Extended X-ray Absorption Fine Structure Study

Published online by Cambridge University Press:  01 January 2024

Rainer Dähn ,
Michel Jullien ,
André M. Scheidegger ,
Christophe Poinssot ,
Bart Baeyens  and
Michael H. Bradbury
Rainer Dähn*
Affiliation:
Laboratory for Waste Management, Paul Scherrer Institut, Villigen, CH-5232, Switzerland
Michel Jullien
Affiliation:
Commissariat à l’Energie Atomique, CEA-Cadarache, DEN/DTN/SMTM/LMTE F-13108 St Paul lez Durance Cedex, France
André M. Scheidegger
Affiliation:
Laboratory for Waste Management, Paul Scherrer Institut, Villigen, CH-5232, Switzerland
Christophe Poinssot
Affiliation:
Commissariat à l’Energie Atomique, CEA-Saclay, DEN/DPC/SCPA/LCRE, F-91191 Gif-sur-Yvette Cedex, France
Bart Baeyens
Affiliation:
Laboratory for Waste Management, Paul Scherrer Institut, Villigen, CH-5232, Switzerland
Michael H. Bradbury
Affiliation:
Laboratory for Waste Management, Paul Scherrer Institut, Villigen, CH-5232, Switzerland
*
*E-mail address of corresponding author: [email protected]
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Abstract

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The aim of this work was to investigate whether neoformed Ni-phyllosilicates can be observed and identified using transmission electron microscopy (TEM) in combination with energy dispersive spectroscopy (EDS). The investigations focused on Ni-phyllosilicates formed from Ni-doped montmorillonite. The reaction conditions (pH 8, [Ni]initial = 660 and 3300 µM, 0.2 M Ca(NO3)2) employed were similar to those used in previous polarized extended X-ray absorption fine structure (P-EXAFS) investigations of neoformed Ni-phyllosilicates in a Ni-montmorillonite system.

The TEM investigations of Ni-doped montmorillonite revealed the presence of small, thin particles consisting of coherent stacks that yielded only three to five lattice fringes with spacings consistent with smectites. These small particles were neoformed phyllosilicates, based on the fact that the small particles were only observed in Ni-doped samples and their Ni content, as determined from EDS analysis, was high (up to 10 wt.% NiO). Furthermore, the particles did not possess the characteristic properties of montmorillonite particles, such as a 2:1 Si to Al ratio; instead these particles were rich in Si (up to 75 wt.% SiO2). Unlike montmorillonite, these particles did not contain any Fe. The particles were also significantly more resistant to electron beam damage than montmorillonite particles, and EXAFS measurements confirmed the presence of neoformed Ni-phyllosilicates.

The TEM study further indicates the presence of a variety of additional minerals (e.g. cristobalite, halloysite) and an X-ray amorphous Si-rich phase. A Ni signal could only be detected in the latter phase at high Ni loadings (403 µmol/g), suggesting that Ni uptake at low metal loadings (<90 µmol/g) is mainly controlled by the neoformation of phyllosilicates.

Keywords

EXAFSMontmorilloniteNeoformed PhyllosilicatesNiTEM
Type
Research Article
Information
Clays and Clay Minerals , Volume 54 , Issue 2 , April 2006 , pp. 209 - 219
Copyright
Copyright © 2006, The Clay Minerals Society

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