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An empirical Scherrer equation for weakly swelling mixed-layer minerals, especially illite-smectite

Published online by Cambridge University Press:  09 July 2018

M. Jaboyedoff ,
B. Kübler  and
Ph. Thélin
M. Jaboyedoff
Affiliation:
Institut de Minéralogie et Pétrographie Université de Lausanne, BFSH2, 1015 Lausannne, Switzerland Institut de Géologie, Université de Neuchâtel, Rue Emile-Argand, 11, 2007 Neuchâtel, Switzerland
B. Kübler
Affiliation:
Institut de Géologie, Université de Neuchâtel, Rue Emile-Argand, 11, 2007 Neuchâtel, Switzerland
Ph. Thélin
Affiliation:
Institut de Minéralogie et Pétrographie Université de Lausanne, BFSH2, 1015 Lausannne, Switzerland
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Abstract

The Scherrer equation links the measured width of an X-ray diffraction peak (Scherrer width, SW) to the number of stacked cells (N) in the direction normal to the diffracting planes. The formula is only valid for one d-value occurring in the coherently diffracting domain. This equation can be modified for weakly swelling mixed-layer minerals. This assumes that the peak broadening caused by the mixed-layering is proportional to the amount of swelling component (S) and that the effects of size and mixed-layering are additive.

If two SW can be measured on XRD patterns from samples treated in two different ways (such as air dried or glycolated), N and S can be determined. This equation is applicable to illite-smectite mixed-layer minerals with high illitic content. The results are most accurate for N>30. The use of Scherrer's equation is discussed.

Type
Research Article
Information
Clay Minerals , Volume 34 , Issue 4 , December 1999 , pp. 601 - 617
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1999

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