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Accurate quantitative analysis of clay and other minerals in sandstones by XRD: comparison of a Rietveld and a reference intensity ratio (RIR) method and the importance of sample preparation

Published online by Cambridge University Press:  09 July 2018

S. Hillier
S. Hillier*
Affiliation:
Macaulay Land Use Research Institute, Craigiebuckler, Aberdeen AB15 8QH, UK
*
*E-mail: [email protected]
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Abstract

X-ray diffraction is used widely for quantitative analysis of geological samples but studies which document the accuracy of the methods employed are not numerous. Synthetic sandstones of known composition are used to compare a ‘routine application’ of a Rietveld and a reference intensity ratio (RIR) method of quantitative phase analysis. Both methods give similar results accurate to within ~±3 wt.% at the 95% confidence level. The high degree of accuracy obtained is believed to depend to a large extent on the spray-drying method of sample preparation used to eliminate preferred orientation.

Keywords

XRDquantitative analysisRietveld analysis
Type
Research Article
Information
Clay Minerals , Volume 35 , Issue 1 , March 2000 , pp. 291 - 302
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 2000

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