Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-26T08:05:12.576Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray diffraction from partially disordered layer structures: General case

Published online by Cambridge University Press:  09 July 2018

B. K. Ray ,
A. K. De  and
S. Bhattacherjee
B. K. Ray
Affiliation:
Physics Department, Indian Institute of Technology, Kharagpur 721302, India
A. K. De
Affiliation:
Physics Department, Indian Institute of Technology, Kharagpur 721302, India
S. Bhattacherjee
Affiliation:
Physics Department, Indian Institute of Technology, Kharagpur 721302, India
Get access Rights & Permissions [Opens in a new window]

Abstract

A general expression for diffracted intensities from partially ordered layer structures with a ‘mistake’ has been calculated. The ‘mistake’ consists of a shift of a layer parallel to adjacent layers by any arbitrary fraction b/q along the b axis, q being any integer. The expression is free from any simplifying approximations.

Résumé

Résumé

On a calculé une relation donnant les intensités diffractées par des structures en feuillets partiellement ordonnés comportant une ‘faute’. La ‘faute’ est constituée par un déplacement d'un feuillet parallèle par rapport aux feuillets voisins, déplacement se faisant selon une fraction arbitraire quelconque b/q le long de l'axe b, qétant un entier. La relation ne comporte aucune approximation simplificatrice.

Kurzreferat

Kurzreferat

Es wurde ein allgemeiner Ausdruck berechnet für die Beugungsintensitäten von mit einem Fehler behafteten, teilweise geordneten Schichtstrukturen. Dieser Fehler besteht in einer a-Verschibung einer zu benachbarten Schichten parallelen Schicht für jede willkürliche Beugung b/q längs der b-Achse, wobei q irgendeine ganze Zahl ist. Dieser Ausdruck ist frei von vereinfachenden Annahmen.

Resumen

Resumen

Se ha calculado una expresión general para intensidades difractadas de estructuras de capas parcialmente ordenadas con un ‘error’. El ‘error’ consiste en un desplazamiento de una capa paralela a capas adyacentes en cualquier fracción b/q arbitraria a lo largo del eje, siendo q un número entero. La expresión está libre de aproximaciones simplificatorias.

Type
Research Article
Information
Clay Minerals , Volume 15 , Issue 4 , December 1980 , pp. 393 - 398
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1980

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Brindley, G.W. (1961) X-ray diffraction by layer lattices with random layer displacements. Pp. 446-466 in: The X-ray IDentification and Crystal Structures of Clay Minerals (G. Brown, editor), Mineralogical Society, London.Google Scholar
Brindley, G.W. & MéRing, J (1951) Diffractions Des rayons X par les structures en couches Desordonnées. I. Acta Cryst. 4, 441–47.Google Scholar
Plancon, A & Tchoubar, C (1977) Determination of structural Defects in phyllosilicates by X-ray powDer diffraction. I. Clays Clay Miner. 25, 430–435.Google Scholar
Warren, B.E. (1941) Diffraction by random layers. Physical Rev. 59, 693–698.Google Scholar
Wilson, A.J.C. (1949) X-ray diffraction by random layers: iDeal line profiles and Determination of structure amplituDes from observed line profiles. Acta Cryst. 2, 245–251.Google Scholar
Wilson, A.J.C. (1962) X-ray Optics. Methuen, London.Google Scholar