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The measurement of orientation distribution and its application to quantitative X-ray diffraction analysis

Published online by Cambridge University Press:  09 July 2018

R.M. Taylor  and
K. Norrish
R.M. Taylor
Affiliation:
Division of Soils, C.S.I.R.O., Adelaide, South Australia
K. Norrish
Affiliation:
Division of Soils, C.S.I.R.O., Adelaide, South Australia
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Abstract

Using X-ray techniques, the orientation distributions of crystal planes in laboratory prepared and naturally occurring aggregates were measured. A small specimen was mounted on the axis of a goniometer and the diffracted intensity measured as the specimen was rotated. Mo radiation was used to reduce the absorption effects. A mathematical relation between the distribution of particles and the distribution of crystal planes was derived for platy and fibrous particles in flake-like and rod-shaped specimens.

When diffracted intensities of the 001 reflection of several different kaolinites were corrected for the degree of orientation in the respective specimens, a constant value was obtained. This would enable quantitative diffraction analyses to be made without the large errors that can be introduced by orientation effects. The degree of particle orientation achieved appeared to be more dependent on particle morphology than on the method of sample preparation or formation.

Type
Research Article
Information
Clay Minerals , Volume 6 , Issue 3 , July 1966 , pp. 127 - 142
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1966

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References

Brindley, G.W. (1951) X-ray Identification and Crystal Structures of Clay Minerals (Brindley, G. W., editor), Chap. I, p. 8, Mineralogical Society, London.Google Scholar
Brindley, G.W. & Kurtossy, S.S. (1961) Am. Miner. 46, 1205.Google Scholar
Brindley, G.W. & Kurtossy, S.S. (1962) Am. Miner. 47, 1213.Google Scholar
Cox, R.W. & Williamson, W.O. (1958) Trans. Br. Ceram. Soc. 57, 85.Google Scholar
Kaarsberg, E.A. (1959) J. Geol. 67, 447.Google Scholar
Kinter, E.B. & Diamond, S. (1956) Soil Sci. 81, 111.Google Scholar
Klug, H.P. & Alexander, L.E. (1954) X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, p. 174, p. 295. Wiley, New York.Google Scholar
Macewan, D.M.C. (1949) Research, Lond. 2, 459.Google Scholar
Niskanen, E. (1964) Am. Miner. 49, 705.Google Scholar
Norrish, K. & Taylor, R.M. (1962) Clay Miner. Bull. 5, 98.Google Scholar
Parrish, W. (1962) Advances in X-ray Diffractometry and X-ray Spectrography (Parrish, W., editor), p. 11, Centrex, Eindhoven.Google Scholar
Rose, H.J. Jr., Adler, I. & Flannagan, F.J. (1963) Appl. Spectrosc. 17, 81.CrossRefGoogle Scholar
Schiaffino, L. (1962) Periodico Miner. 31, 7.Google Scholar
Silverman, E.N. & Bates, T.F. (1960) Am. Miner. 45, 60.Google Scholar
Sutherland, H.H. & MacEwan, D.M.C. (1961) Acta Univ. Carol. Geol. suppl. 1, 91.Google Scholar
van der Marel, H.W. (1960) Silic. Ind. 25, 31.Google Scholar
van der Marel, H.W. (1962) Am. Miner. 46, 1205.Google Scholar