Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Meeker, William Q.
1987.
Limited Failure Population Life Tests: Application to Integrated Circuit Reliability.
Technometrics,
Vol. 29,
Issue. 1,
p.
51.
Kurz, Daniel
Lewitschnig, Horst
and
Pilz, Juergen
2021.
Flexible time reduction method for burn‐in of high‐quality products.
Quality and Reliability Engineering International,
Vol. 37,
Issue. 6,
p.
2900.