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Application of a Bayesian network to integrated circuit tester diagnosis

Published online by Cambridge University Press:  27 February 2009

Daniel Mittelstadt ,
Robert Paasch  and
Bruce D’Ambrosio
Daniel Mittelstadt
Affiliation:
Department of Mechanical Engineering, Oregon State University, Corvallis, OR 97331-4602
Robert Paasch
Affiliation:
Department of Mechanical Engineering, Oregon State University, Corvallis, OR 97331-4602
Bruce D’Ambrosio
Affiliation:
Department of Computer Science, Oregon State University, Corvallis, OR 97331-4602
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Abstract

Research efforts to implement a Bayesian belief-network-based expert system to solve a real-world diagnostic problem – the diagnosis of integrated circuit (IC) testing machines – are described. The development of several models of the IC tester diagnostic problem in belief networks also is described, the implementation of one of these models using symbolic probabilistic inference (SPI) is outlined, and the difficulties and advantages encountered are discussed. It was observed that modeling with interdependencies in belief networks simplifies the knowledge engineering task for the IC tester diagnosis problem, by avoiding procedural knowledge and focusing on the diagnostic component’s interdependencies. Several general model frameworks evolved through knowledge engineering to capture diagnostic expertise that facilitated expanding and modifying the networks. However, model implementation was restricted to a small portion of the modeling, that of contact resistance failures, which were due to time limitations and inefficiencies in the prototype inference software we used. Further research is recommended to refine existing methods, in order to speed evaluation of the models created in this research. With this accomplished, a more complete diagnosis can be achieved.

Keywords

Bayesian NetworkIntegrated Circuit (IC)Symbolic Probabilistic Inference (SPI)
Type
Articles
Information
AI EDAM , Volume 9 , Issue 1 , January 1995 , pp. 51 - 65
Copyright
Copyright © Cambridge University Press 1995

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References

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