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An analysis and approach to using existing ontological systems for applications in manufacturing

Published online by Cambridge University Press:  26 December 2000

CRAIG SCHLENOFF
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
PETER DENNO
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
ROB IVESTER
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
DON LIBES
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
SIMON SZYKMAN
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899

Abstract

This paper reports on the results of an analysis of existing ontological systems to determine which is most appropriate for the manufacturing domain. In particular, this involved the exploration of efforts that are studying both the uses of ontologies in the general sense and those that are using ontologies for domain-specific purposes. Eleven ontological systems were analyzed and, using a set of analysis criteria, it was determined that the Cyc (Cyc is a registered trademark of Cycorp Inc.) system was most appropriate for modeling concepts in the manufacturing domain. After the analysis is described, examples are given to show how manufacturing concepts could be modeled in the Cyc system. This work is part of a larger project whose objective is to move closer to the ultimate goal of seamless manufacturing systems integration using the principle behind ontological engineering to unambiguously define domain-specific concepts. The output of this work will be a taxonomy of manufacturing terms and concepts along with formal definitions of exactly what each of those terms and concepts mean and how they interrelate.

Type
Research Article
Copyright
© 2000 Cambridge University Press

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