Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-18T01:22:53.346Z Has data issue: false hasContentIssue false

Developments in test software philosophy and techniques

Published online by Cambridge University Press:  04 July 2016

D.J.K. Wise*
Affiliation:
British Aerospace plc

Extract

Complex electronic systems are structured into functional units, printed circuit boards and components. During the manufacturing process testing starts at the component level and is carried out progressively at PCB, functional test and finally total system level.

When the equipment is in service, the reverse process is followed. That is, at the system level the suspect unit is diagnosed and replaced. This unit is then tested and if faulty diagnosed to the faulty board. This in turn is tested to find the faulty component. The testing of functional units, boards and complex components (referred to here as the ‘box’) is carried out on Automatic Test Equipment both at the factory and field level. In each case the test problem needs to be addressed during design to ensure that adequate access is given to the internal function of the item.

Type
Testing for Space and Weapon Products
Copyright
Copyright © Royal Aeronautical Society 1983 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)