Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-23T15:33:17.338Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Texture Measurement Using a Position Sensitive Detector

Published online by Cambridge University Press:  06 March 2019

L. Wcislak ,
H.J. Bunge ,
M. Haase  and
C. Nauer-Gerhardt
L. Wcislak
Affiliation:
Department of Physical Metallurgy Technical University of Clausthal, FRG
H.J. Bunge
Affiliation:
Department of Physical Metallurgy Technical University of Clausthal, FRG
M. Haase
Affiliation:
Siemens Analytical, Siemens AG, Karlsruhe, FRG
C. Nauer-Gerhardt
Affiliation:
Siemens Analytical, Siemens AG, Karlsruhe, FRG
Get access

Abstract

For pole figure measurement the flat sample has to be tilted which leads to peak broadening and peak overlap in peak-reach diffraction spectra. Using a linear position sensitive detector /PSD/, complete diffraction spectra can be obtained in each sample orientation. Peak separation can then be done by Gaussian fitting. When measuring with a PSD, each diffraction peak corresponds to a particular diffraction vector. This has to be taken into consideration by a coordinate transformation. The PSD-method is the only practical method of texture measurement for materials with complex diffraction spectra.

Type
V. Texture Analysis by XRD
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 309 - 319
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Bunge, H.J., Wenk, H.R. and Pannetier, J. Neutron Diffraction Texture Analysis using a 2θ-Position Sensitive Detector. Textures and Microstnictures 5, 153–170 (1982)Google Scholar
2. Heizmaim, J.J. and Laruelle, C. Simultaneous Measurement, of Several X Ray Pole Figures, in: J. Appl. Cryst. 19, 467–472 (1986)Google Scholar
3. Parrish, W. and Huang, T. C. Accuracy of the Profile Fitting Method for X-Ray Diffractometry, in: NBS Special Publication 567, (1980) 95–111 Google Scholar
4. Schulz, S. Principles of X-Ray Diffraction Technique. in: J. Appl. Phys. 11 (1948) 233 Google Scholar
5. Wcislak, L. and Bunge, H.J. Simultaneous Measurement of Pole Figures by X-Ray Diffraction Using a 2θ-Position Sensitive Detector. Proc. 1COTOM-9 (1990), Textures and Microstructures, in printGoogle Scholar