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X-Ray Probe with Collimation of the Secondary Beam

Published online by Cambridge University Press:  06 March 2019

Kurt F. J. Heinrich
Kurt F. J. Heinrich*
Affiliation:
E. I. du Pont de Nemours and Co. Wilmington, Delaware
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Abstract

An attachment to a commercial flat-crystal X-ray fluorescent goniometer permits analysis of small areas. The selection of the sample area is achieved by collimating the secondary beam. The geometry of the probe, its stage, and counting statistics applied to the probe are discussed. Experimental data are shown referring to determination of spot size, counting rates obtained, and both qualitative and quantitative applications.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 516 - 526
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

1. Adler, I., Axelrod, J., and Branco, J. J. R., Advances in X-Ray Analysis, Vol. 2, University of Denver, Plenum Press, New York, 1960, pp. 167–173.Google Scholar
2. Thatcher, J. W. and Campbell, W. J.. “Applications of a Fluorescent X-Ray gpectrograph Probe,” Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Pittsburgh Pa., March 1959.Google Scholar
3. Heinrich, K. F. J. and McKinley, T. D., “X-Ray Spectrometry Applied to Small Areas Using a Commercial Instrument,” Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy. Pittsburgh, pa., March 1960.Google Scholar
4. Heinrich, K. F. J., Advances in X-Ray Analysis, Vol. 3, University of Denver, Plenum Press, New York, 1960, pp. 95–107.Google Scholar