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X-Ray Imaging: Status and Trends

Published online by Cambridge University Press:  06 March 2019

R.W. Ryon ,
H.E. Martz ,
J.M. Hernandez ,
J.J. Haskins ,
R.A. Day ,
J.M. Brase ,
Brian Cross  and
David Wherry
R.W. Ryon
Affiliation:
Lawrence Livermore National Laboratory Livermore, California 94550
H.E. Martz
Affiliation:
Lawrence Livermore National Laboratory Livermore, California 94550
J.M. Hernandez
Affiliation:
Lawrence Livermore National Laboratory Livermore, California 94550
J.J. Haskins
Affiliation:
Lawrence Livermore National Laboratory Livermore, California 94550
R.A. Day
Affiliation:
Lawrence Livermore National Laboratory Livermore, California 94550
J.M. Brase
Affiliation:
Lawrence Livermore National Laboratory Livermore, California 94550
Brian Cross
Affiliation:
Kevex, Inc. Foster City, California 94404
David Wherry
Affiliation:
Kevex, Inc. Foster City, California 94404
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Extract

There is a veritable renaissance occurring in x-ray imaging. X-ray imaging by radiography has been a highly developed technology in medicine and industry for many years. However, high resolution imaging has not generally been practical because sources have been relatively dim and diffuse, optical elements have been nonexistant for most applications, and detectors have been slow and of low resolution. Materials analysis needs have therefore gone unmet. Rapid progress is now taking place because we are able to exploit developments in microelectronics and related material fabrication techniques, and because of the availability of intense x-ray sources.

Type
I. Microbeam Techniques and Imaging Methods for Materials Characterization
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 35 - 52
Copyright
Copyright © International Centre for Diffraction Data 1987

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