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X-ray Imaging of Surface and Internal Structure

Published online by Cambridge University Press:  06 March 2019

John C. Russ
John C. Russ*
Affiliation:
Materials Science and Engineering Department North Carolina State University Raleigh, NC 27695
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Extract

The most familiar result from X-ray analysis is a spectrum (on a chart recording or on film), or perhaps a short list of values (concentrations, d-spacings, etc.) taken from such a spectrum. X-ray pictures are usually associated in our minds with the hospital emergency room or the dentist's office. But images formed by X-rays are also an important tool to study materials' structures. Both conventional and unconventional uses of X-rays to study structural and compositional inhomogeneities find widespread application to materials. Applications include characterization of surface topography and composition variation, as well as internal structure. The methods make use of all types of X-ray interaction with materials, including Bragg diffraction and the fluorescence of characteristic X-rays, as well as simple X-ray attenuation due to absorption and scattering.

Type
I. Microbeam Techniques and Imaging Methods for Materials Characterization
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 25 - 34
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

Briggs, A. (1985) An introduction to scanning acoustic microscopy Royal Microscopical Society Handbook #12, Oxford Univ. PressGoogle Scholar
Cunningham, T.G., Davies, R.L., Graham, S.C. (1986) The application o f X-ray microscopy in materials science J. Microscopy 144 pp. 261–27.Google Scholar
Herman, G.T. (1980) Image Reconstruction from Projections - The Fundamentals of Computerized Tomography Academic Press, New York Google Scholar
Negeri, R. (1982) 3-D reconstruction from electron micrographs Proc. 10th Intern. Cong. on Electron Microscopy, Hamburg, pp. 545–55.Google Scholar
Petran, M., Hadravsky, M., Benes, J., Kucera, R., Boyde, A. (1985) The Tandem Scanning Reflected Light Microscope Vol 20 No. 3 Proceedings of the Royal Microscopical Society, pp. 125–13.Google Scholar
Radon, J. (1917) Vber die Bestimmung von Funktionen durch ihre Integralwerte langs gewisser Mannigfaltigheiten Berlin Sachsische Akad. Wissen. 29 pp. 262–27.Google Scholar
Rozgonyi, G.A., Miller, D.C. (1979) X-ray Topographic Techniques for Electronic Materials Characterization in Crystal Growth: A Tutorial Approach (Bardsley, W. et. al. editors), North Holland, New York, pp. 307–35.Google Scholar
Russ, J.C. (1985) XRF and other surface analysis techniques in Advances in X-ray Analysis vol. 29 (Barrett, C.S. et. al,, editors), Plenum, New York, pp. 11–1.Google Scholar
Sasov, A. Yu. (1985) Computerized microtomography in scanning electron microscopy SEM ’85/111, SEM‘ Inc., Chicago, pp. 1109–112.Google Scholar
Strid, K.G. (1986) Tomography: Spatial reconstruction from projections Acta Stereol. 5 no. 2, pp. 103–12.Google Scholar
Wilk, Z. A., Hercules, D.M. (1987) Organic and Elemental Ion Mapping Using Laser Mass Spectrometry Anal. Chem. 59, pp. 1819–182.Google Scholar