Hostname: page-component-848d4c4894-sjtt6 Total loading time: 0 Render date: 2024-07-04T23:04:03.263Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Fluorescence Determination of Trace Elements in Complicated Matrices

Published online by Cambridge University Press:  06 March 2019

Liu Yawen ,
Fan Qinmin  and
Li Daolun
Liu Yawen
Affiliation:
Institute of High Energy Physics, Academia Sinica Beijing, The People's Republic of China
Fan Qinmin
Affiliation:
Institute of High Energy Physics, Academia Sinica Beijing, The People's Republic of China
Li Daolun
Affiliation:
Institute of High Energy Physics, Academia Sinica Beijing, The People's Republic of China
Get access

Abstract

A method for the direct determination of trace elements in light element matrices is described. The intensity of Compton scatter of the incident X-rays from the specimen was used to evaluate the apparent absorption factor for the direct correction for matrix effects. This permits the use of single element standards for samples of varied and complicated matrix composition. Relative errors of approximately 5% were obtained for results in the concentration range of 10-200 ppm.

Type
V. XRF Applications; Fuels and Lubricants, Metals and Alloys, Geological, Heavy Element, Other
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 309 - 314
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Andermann, G. and Kemp, J.W., Anal. Chem. 30: 1306 (1958).Google Scholar
2. Shenberg, C., Hain, A.B. and Amiel, S., Anal, Chem, 45: 1804 (1973).Google Scholar
3. Walker, D., Amer. Mineral. 58: 1069 (1973).Google Scholar
4. Keith, H.D. and Lcomis, T.C., X-ray Spectr. 7 225 (1978)Google Scholar
5. Baron, P., Zevin, L. and of. Each, X-ray Spectr. 10: 57 (1981).Google Scholar
6. Mills, J.C. et al., X-ray Spectr. 10: 131 (1981).Google Scholar
7. Glauque, R.D., Garret, R.B. and Goda, L.Y., Anal. Chem. 49: 62 (1977).Google Scholar
8. Leoni, L. and Saitta, M., X-ray Spectr. 6: 181 (1977).Google Scholar
9. Chamption, K.D., Jylor, J.C. and Whittens, R.N., Anal, Chem. 38: 109 (1966),Google Scholar
10. Reynolds, R.C., Amer. Mineral, 481 1133 (1963),Google Scholar
11. Reynolds, R.C., Amer. Mineral. 52: 1493 (1967).Google Scholar
12. Feather, C.E. and Willins, J.P., X-ray Spectr, 4;41 (1976).Google Scholar
13. Giavique, R.D., Garrett, B. B. and Goda, L.Y., Anal. Chem. 511 511 (1979).Google Scholar
14. Eallak, A.B. and Saleh, N.S., X-ray Spectr. 12: 148 (1983).Google Scholar
15. Markowicz, A., X-ray Spectro, 13 1166 (1984),Google Scholar
16. Rez, P. and Konopka, J., X-ray Spectr. 13;33 (1984).Google Scholar
17. George, R. and Schiekel, M., J. Radlo Anal. Chem. 79: 233 (1983).Google Scholar